@ARTICLE{Melhem_Mutaz_Y._The_2019, author={Melhem, Mutaz Y. and Kish, Laszlo B.}, volume={vol. 26}, number={No 1}, journal={Metrology and Measurement Systems}, pages={37-40}, howpublished={online}, year={2019}, publisher={Polish Academy of Sciences Committee on Metrology and Scientific Instrumentation}, abstract={The Kirchhoff-law-Johnson-noise (KLJN) secure key exchange scheme offers unconditional security, however it can approach the perfect security limit only in the case when the practical system’s parameters approach the ideal behavior of its core circuitry. In the case of non-ideal features, non-zero information leak is present. The study of such leaks is important for a proper design of practical KLJN systems and their privacy amplifications in order to eliminate these problems.}, type={Artykuły / Articles}, title={The problem of information leak due to parasitic loop currents and voltages in the KLJN secure key exchange scheme}, URL={http://journals.pan.pl/Content/110248/PDF/art_04.pdf}, doi={10.24425/mms.2019.126335}, keywords={unconditional security, key exchange, parasitic loop currents and voltages, information leak}, }