@ARTICLE{Chruszczyk_Ł._Finding_2007,
 author={Chruszczyk, Ł. and Grzechca, D. and Rutkowski, J.},
 volume={vol. 55},
 number={No 3},
 journal={Bulletin of the Polish Academy of Sciences Technical Sciences},
 pages={273-280},
 howpublished={online},
 year={2007},
 abstract={This article presents combined approach to analog electronic circuits testing by means of evolutionary methods (genetic algorithms) and using some aspects of information theory utilisation and wavelet transformation. Purpose is to find optimal excitation signal, which maximises probability of fault detection and location. This paper focuses on most difficult case where very few (usually only input and output) nodes of integrated circuit under test are available.},
 type={Artykuły / Articles},
 title={Finding of optimal excitation signal for testing of analog electronic circuits},
 URL={http://journals.pan.pl/Content/111495/PDF/(55-3)273.pdf},
 keywords={fault detection, fault location, dictionary fault diagnosis, analog electronic circuits, wavelet transform, genetic algorithm},
}