@ARTICLE{Świadkowski_Bartosz_ARMScope_2020,
 author={Świadkowski, Bartosz and Piasecki, Tomasz and Rudek, Maciej and Świątkowski, Michał and Gajewski, Krzysztof and Majstrzyk, Wojciech and Babij, Michał and Dzierka, Andrzej and Gotszalk, Teodor},
 volume={vol. 27},
 number={No 1},
 journal={Metrology and Measurement Systems},
 pages={119-130},
 howpublished={online},
 year={2020},
 publisher={Polish Academy of Sciences Committee on Metrology and Scientific Instrumentation},
 abstract={Scanning probe microscopy (SPM) since its invention in the 80’s became very popular in examination of many different sample parameters, both in university and industry. This was the effect of bringing this technology closer to the operator. Although the ease of use opened a possibility for measurements without high labour requirement, a quantitative analysis is still a limitation in Scanning ProbeMicroscopes available on the market. Based on experience of Nano-metrology Group, SPM still can be considered as a tool for quantitative examination of thermal, electrical and mechanical surface parameters. In this work we present an ARMScope platform as a versatile SPM controller that is proved to be useful in a variety of applications: fromatomic-resolution STM (Scanning TunnellingMicroscopy) toMulti-resonance KPFM (Kelvin Probe force microscopy) to commercial SEMs (Scanning electron microscopes).},
 type={Article},
 title={ARMScope – the versatile platform for scanning probe microscopy systems},
 URL={http://journals.pan.pl/Content/115042/PDF/09_MMS_1_2020.pdf},
 doi={10.24425/mms.2020.131711},
 keywords={Scanning probe microscopy, AFM, Kelvin Probe force microscopy, scanning tunnelling microscopy},
}