@ARTICLE{Gogolewski_Damian_An_2020, author={Gogolewski, Damian and Makieła, Włodzimierz and Nowakowski, Łukasz}, volume={vol. 27}, number={No 4}, journal={Metrology and Measurement Systems}, pages={659-672}, howpublished={online}, year={2020}, publisher={Polish Academy of Sciences Committee on Metrology and Scientific Instrumentation}, abstract={The objective of the study was to assess the potential use of optical measuring instruments to determine the minimum chip thickness in face milling. Images of scanned surfaces were analyzed using mother wavelets. Filtration of optical signals helped identify the characteristic zones observed on the workpiece surface at the beginning of the cutting process. The measurement data were analyzed statistically. The results were then used to estimate how accurate each measuring system was to determine the minimum uncut chip thickness. Also, experimental verification was carried out for each mother wavelet to assess their suitability for analyzing surface images.}, type={Article}, title={An assessment of applicability of the two-dimensional wavelet transform to assess the minimum chip thickness determination accuracy}, URL={http://journals.pan.pl/Content/117861/PDF/art08.pdf}, doi={10.24425/mms.2020.134845}, keywords={Wavelet analysis, face milling, minimum chip thickness, surface texture}, }