@ARTICLE{Tadeusiewicz_Michał_Diagnosis_2016,
 author={Tadeusiewicz, Michał and Hałgas, Stanisław},
 volume={vol. 23},
 number={No 2},
 journal={Metrology and Measurement Systems},
 pages={239-250},
 howpublished={online},
 year={2016},
 publisher={Polish Academy of Sciences Committee on Metrology and Scientific Instrumentation},
 abstract={The paper deals with fault diagnosis of nonlinear analogue integrated circuits. Soft spot short defects are analysed taking into account variations of the circuit parameters due to physical imperfections as well as self-heating of the chip. A method enabling to detect, locate and estimate the value of a spot defect has been developed. For this purpose an appropriate objective function was minimized using an optimization procedure based on the Fibonacci method. The proposed approach exploits DC measurements in the test phase, performed at a limited number of accessible points. For illustration three numerical examples are given.},
 type={Artykuły / Articles},
 title={Diagnosis of Soft Spot Short Defects in Analog Circuits Considering the Thermal Behaviour of the Chip},
 URL={http://journals.pan.pl/Content/90407/PDF/10.1515-mms-2016-0023%20paper07.pdf},
 doi={10.1515/mms-2016-0023},
 keywords={analog circuits, fault diagnosis, short spot defects, thermal effects},
}