TY - JOUR L1 - http://journals.pan.pl/Content/102761/PDF/IJET_1_2018_7_1079.pdf L2 - http://journals.pan.pl/Content/102761 PY - 2018 IS - No 1 DO - 10.24425/118150 KW - analog circuits KW - fault diagnosis KW - linear circuits KW - multiple soft faults KW - verification technique A1 - Tadeusiewicz, MichaƂ A1 - Ossowski, Marek PB - Polish Academy of Sciences Committee of Electronics and Telecommunications VL - vol. 64 DA - 2018.03.30 T1 - A Verification Technique for Multiple Soft Fault Diagnosis of Linear Analog Circuits UR - http://journals.pan.pl/dlibra/publication/edition/102761 T2 - International Journal of Electronics and Telecommunications ER -