The paper concerns the problem of treatment of the systematic effect as a part of the coverage interval associated with the measurement result. In this case the known systematic effect is not corrected for but instead is treated as an uncertainty component. This effect is characterized by two components: systematic and random. The systematic component is estimated by the bias and the random component is estimated by the uncertainty associated with the bias. Taking into consideration these two components, a random variable can be created with zero expectation and standard deviation calculated by randomizing the systematic effect. The method of randomization of the systematic effect is based on a flatten-Gaussian distribution. The standard uncertainty, being the basic parameter of the systematic effect, may be calculated with a simple mathematical formula. The presented evaluation of uncertainty is more rational than those with the use of other methods. It is useful in practical metrological applications.

JO - Metrology and Measurement Systems L1 - http://journals.pan.pl/Content/107071/PDF/Journal10178-VolumeXVII+Issue3_11+paper.pdf L2 - http://journals.pan.pl/Content/107071 IS - No 3 EP - 446 KW - measurement uncertainty KW - coverage interval KW - systematic effect KW - randomization ER - A1 - Fotowicz, PaweÅ‚ PB - Polish Academy of Sciences Committee on Metrology and Scientific Instrumentation JF - Metrology and Measurement Systems SP - 439 T1 - Systematic Effect as a Part of the Coverage Interval UR - http://journals.pan.pl/dlibra/docmetadata?id=107071 DOI - 10.2478/v10178-010-0037-1