TY - JOUR N2 - A new simple design methodology which makes LDR output nearly insensitive to jumps of the load current for long times is proposed. This methodology is tested for more than 104 seconds. Our procedure leans on cross coupling of the time second derivative of the LDR power transistor gate and drain voltages along with their currents. This technique keeps low values of these currents in order of nano or hundreds of micro amperes for undershot or overshot cases, respectively. The introduced methodology has been applied to a standard CMOS of 0.18μm technology for NMOS transistors and validated using MATLAB R2014a. L1 - http://journals.pan.pl/Content/110230/PDF/42.pdf L2 - http://journals.pan.pl/Content/110230 PY - 2019 IS - No 2 EP - 327 DO - 10.24425/ijet.2019.126317 KW - low drop-out regulator KW - cross coupling KW - jumps of the load current KW - undershot KW - overshot A1 - Abdel_Monem, Ahmed A1 - El_Mashade, Mohamed B. A1 - Dabbous, T.E. PB - Polish Academy of Sciences Committee of Electronics and Telecommunications VL - vol. 65 DA - 2019.06.13 T1 - A New Design Methodology For Enhancing The Transient Loading Of Low Drop-out Regulators (LDRs) SP - 319 UR - http://journals.pan.pl/dlibra/publication/edition/110230 T2 - International Journal of Electronics and Telecommunications ER -