TY - JOUR N2 - Ever rising increase in number of wireless services has prompted the use of spatial multiplexing through null steering.Various algorithms provide electronic control of antenna array pattern. Simulation-driven technique further introduces correction in array factor to account for array geometry. Taguchi method is used here to combat interference in practical antenna arrays of non-isotropic elements, by incorporating the effect of antenna element pattern on array pattern control in the optimization algorithm. 4-element rectangular and bowtie patch antenna arrays are considered to validate the effectiveness of Taguchi optimization. The difference in the computed excitations and accuracy of null steering confirms the dependence of beam pattern on element factor and hence eliminates the need for extra computations performed byconventional algorithms based on array factor correction. Taguchi method employs an orthogonal array and converges rapidly to the desired radiation pattern in 25 iterations, thus signifying it to be computationally cost-effective. A higher gain and a significant reduction in side lobe level (SLL) was obtained for the bowtie array. Further, due to feed along parallel edges of the patch, the radiating edges being slanted to form the bow shape results in a significant reduction in the area as compared with the rectangular patch designed to resonate at the same frequency. L1 - http://journals.pan.pl/Content/115048/PDF/01_MMS_1_2020.pdf L2 - http://journals.pan.pl/Content/115048 PY - 2020 IS - No 1 EP - 17 DO - 10.24425/mms.2020.131717 KW - interference suppression KW - non-isotropic antenna array KW - mutual coupling KW - simulation-controlled optimization KW - Taguchi method A1 - Kaur, Baljinder A1 - Marwaha, Anupma PB - Polish Academy of Sciences Committee on Metrology and Scientific Instrumentation VL - vol. 27 DA - 2020.03.18 T1 - Optimized null steering in compact bowtie antenna array using simulation driven Taguchi method SP - 3 UR - http://journals.pan.pl/dlibra/publication/edition/115048 T2 - Metrology and Measurement Systems ER -