TY - JOUR N2 - A ternary photonic crystal with left-handed material (LHM) layer is examined for refractometric applications. One of the layers is assumed to be air and treated as an analyte. The transmittance from the ternary photonic crystal is studied in details and the wavelength shift due to the change in the refractive index of the analyte is investigated. The transmittance is investigated with the parameters of the LHM. It is found that the wavelength shift can be significantly enhanced with the decrease of both real part of the LHM permittivity and thickness. L1 - http://journals.pan.pl/Content/115320/PDF/main.pdf L2 - http://journals.pan.pl/Content/115320 PY - 2018 IS - No 3 EP - 241 KW - Photonic crystal KW - Left-handed material KW - Sensor KW - Refractometry application A1 - Taya, S.A. PB - Polish Academy of Sciences (under the auspices of the Committee on Electronics and Telecommunication) and Association of Polish Electrical Engineers in cooperation with Military University of Technology VL - vol. 26 DA - 14.07.2018 T1 - Ternary photonic crystal with left-handed material layer for refractometric application SP - 236 UR - http://journals.pan.pl/dlibra/publication/edition/115320 T2 - Opto-Electronics Review ER -