TY - JOUR N2 - A review of night vision metrology is presented in this paper. A set of reasons that create a rather chaotic metrologic situation on night vision market is presented. It is shown that there has been made a little progress in night vision metrology during last decades in spite of a big progress in night vision technology at the same period of time. It is concluded that such a big discrep- ancy between metrology development level and technology development can be an obstacle in the further development of night vision technology. L1 - http://journals.pan.pl/Content/116135/PDF/opelre_2015_21.pdf L2 - http://journals.pan.pl/Content/116135 PY - 2015 IS - No 2 EP - 164 KW - metrology KW - night vision A1 - Chrzanowski, Krzysztof PB - Polish Academy of Sciences (under the auspices of the Committee on Electronics and Telecommunication) and Association of Polish Electrical Engineers in cooperation with Military University of Technology VL - vol. 23 DA - 07.04.2015 T1 - Review of night vision metrology SP - 149 UR - http://journals.pan.pl/dlibra/publication/edition/116135 T2 - Opto-Electronics Review ER -