This paper deals with multiple soft fault diagnosis of nonlinear analog circuits comprising bipolar transistors characterized by the Ebers-Moll model. Resistances of the circuit and beta forward factor of a transistor are considered as potentially faulty parameters. The proposed diagnostic method exploits a strongly nonlinear set of algebraic type equations, which may possess multiple solutions, and is capable of finding different sets of the parameters values which meet the diagnostic test. The equations are written on the basis of node analysis and include DC voltages measured at accessible nodes, as well as some measured currents. The unknown variables are node voltages and the parameters which are considered as potentially faulty. The number of these parameters is larger than the number of the accessible nodes. To solve the set of equations the block relaxation method is used with different assignments of the variables to the blocks. Next, the solutions are corrected using the Newton-Raphson algorithm. As a result, one or more sets of the parameters values which satisfy the diagnostic test are obtained. The proposed approach is illustrated with a numerical example.

JO - Metrology and Measurement Systems L1 - http://journals.pan.pl/Content/90285/PDF/Journal10178-VolumeXXI+Issue4_05.pdf L2 - http://journals.pan.pl/Content/90285 IS - No 4 EP - 674 KW - analog circuits KW - BJT circuits KW - fault diagnosis KW - multiple faults ER - A1 - Tadeusiewicz, Michał A1 - Hałgas, Stanisław PB - Polish Academy of Sciences Committee on Metrology and Scientific Instrumentation JF - Metrology and Measurement Systems SP - 663 T1 - Multiple Soft Fault Diagnosis of Bjt Circuits UR - http://journals.pan.pl/dlibra/docmetadata?id=90285 DOI - 10.2478/mms-2014-0051