TY - JOUR N2 - The paper deals with fault diagnosis of nonlinear analogue integrated circuits. Soft spot short defects are analysed taking into account variations of the circuit parameters due to physical imperfections as well as self-heating of the chip. A method enabling to detect, locate and estimate the value of a spot defect has been developed. For this purpose an appropriate objective function was minimized using an optimization procedure based on the Fibonacci method. The proposed approach exploits DC measurements in the test phase, performed at a limited number of accessible points. For illustration three numerical examples are given. L1 - http://journals.pan.pl/Content/90407/PDF/10.1515-mms-2016-0023%20paper07.pdf L2 - http://journals.pan.pl/Content/90407 PY - 2016 IS - No 2 EP - 250 DO - 10.1515/mms-2016-0023 KW - analog circuits KW - fault diagnosis KW - short spot defects KW - thermal effects A1 - Tadeusiewicz, Michał A1 - Hałgas, Stanisław PB - Polish Academy of Sciences Committee on Metrology and Scientific Instrumentation VL - vol. 23 DA - 2016.06.30 T1 - Diagnosis of Soft Spot Short Defects in Analog Circuits Considering the Thermal Behaviour of the Chip SP - 239 UR - http://journals.pan.pl/dlibra/publication/edition/90407 T2 - Metrology and Measurement Systems ER -