Details

Title

Probability of Secrecy Outage in Cognitive Radio Networks over Rician-Fading Channels

Journal title

International Journal of Electronics and Telecommunications

Yearbook

2016

Numer

No 2

Publication authors

Divisions of PAS

Nauki Techniczne

Publisher

Polish Academy of Sciences Committee of Electronics and Telecommunications

Date

2016

Identifier

ISSN 2081-8491 (until 2012) ; eISSN 2300-1933 (since 2013)

References

Li (2012), Secure communications via sending artificial noise by the receiver : Outage secrecy capacity / Region analysis vol no pp Oct, IEEE Commun Lett, 16, 1628, doi.org/10.1109/LCOMM.2012.081612.121344 ; Maurer (1993), Secret key agreement by public discussion from common information Theory vol no pp, IEEE Trans, 39, 733. ; Bloch (2008), Wireless information - theoretic security Theory vol no pp, IEEE Trans, 54, 2515. ; Csiszar (1978), Broadcast channels with confidential messages Theory vol no pp, IEEE Trans, 24, 339. ; Li (2013), Achieving secure transmission with equivalent multiplicative noise in MISO wiretap channels vol no pp, IEEE Commun Lett, 17, 892, doi.org/10.1109/LCOMM.2013.040213.122870 ; Gungor (2013), El Secrecy outage capacity of fading channels Theory vol no pp Aug, IEEE Trans, 9, 59. ; Liu (2013), Outage probability of secrecy capacity over correlated lognormal fading channels vol no pp Feb, IEEE Commun Lett, 17, 289, doi.org/10.1109/LCOMM.2012.120612.121947 ; Leung (1978), The Gaussian wire - tap channel Theory vol no pp, IEEE Trans, 24, 451. ; Wyner (1975), The wire - tap channel vol no pp Oct, Bell Syst, 54, 1355, doi.org/10.1002/j.1538-7305.1975.tb02040.x ; Gopala (2008), El On the secrecy capacity of fading channels Theory vol no pp Oct, IEEE Trans, 54, 4687. ; Sun (2012), Performance of secure communications over correlated fading channels vol no pp Aug, IEEE Sig Process Lett, 19, 479, doi.org/10.1109/LSP.2012.2203302 ; Ferdinand (2014), da de Physical layer secrecy performance of TAS wiretap channels with correlated main and eavesdropper channels vol no pp Feb, IEEE Commun Lett, 3, 86, doi.org/10.1109/WCL.2013.112313.130733

DOI

10.1515/eletel-2016-0021

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