Details

Title

On the Bias of Terminal Based Gain and Offset Estimation Using the ADC Histogram Test Method

Journal title

Metrology and Measurement Systems

Yearbook

2011

Numer

No 1

Publication authors

Divisions of PAS

Nauki Techniczne

Publisher

Polish Academy of Sciences Committee on Metrology and Scientific Instrumentation

Identifier

ISSN 0860-8229

DOI

10.2478/v10178-011-0001-8

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