Details

Title

Two Heuristic Algorithms for Test Point Selection in Analog Circuit Diagnoses

Journal title

Metrology and Measurement Systems

Yearbook

2011

Numer

No 1

Publication authors

Divisions of PAS

Nauki Techniczne

Publisher

Polish Academy of Sciences Committee on Metrology and Scientific Instrumentation

Date

2011

Identifier

ISSN 0860-8229

References

Huertas I. (1993), Test and design for testability of analog and mixed-signal integrated circuits: theoretical basis and pragmatical approaches, null, 75. ; Pułka A. (2007), A Heuristic Fault Dictionary Reduction Methodology, null, 1115. ; Pułka A. (2009), Decision Supporting System Based on Fuzzy Default Reasoning, null, 32. ; Kondagunturi R. (1999), Benchmark Circuits for Analog and Mixed-Signal Testing, null, 217. ; Lin P. (1985), Analogue circuits fault dictionary-New approaches and implementation, Journal of Circuit Theory Applications, 13, 149, doi.org/10.1002/cta.4490130205 ; Hochwald W. (1979), A dc approach for analog fault dictionary determination, IEEE Transactions on Circuits and Systems, 26, 523, doi.org/10.1109/TCS.1979.1084665 ; Rutkowski J. (1993), A DC Approach for Analog fault dictionary determination, null, 877. ; Kamińska B. (1997), Analog and Mixed-Signal Benchmark Circuits - First Release, null, 183. ; Golonek T. (2007), Genetic-Algorithm-Based Method for Optimal Analog Test Points Selection, IEEE Transactions on Circuits and Systems-II: Express Briefs, 54, 2, 117, doi.org/10.1109/TCSII.2006.884112 ; Yang C. (2009), Application of Heuristic Graph Search to Test-Point Selection for Analog Fault Dictionary Techniques, IEEE Transactions on Instrumentation and Measurements, 58, 7, 2145, doi.org/10.1109/TIM.2008.2006725 ; Jiang R. (2010), Multidimensional Fitness Function DPSO Algorithm for Analog Test Point Selection, IEEE Transactions on Instrumentation and Measurement, 59, 6, 1634, doi.org/10.1109/TIM.2009.2021643 ; Farreny H. (1999), Completeness and Admissibility for General Heuristic Search Algorithms-A Theoretical Study: Basic Concepts and Proofs. Kluwer Academic Publisher, Journal of Heuristics, 5, 99, 353, doi.org/10.1023/A:1009617818678 ; Jiang Cui (2010), A novel approach of analog fault classification using a support vector machines classifier, Metrology and Measurement Systems, 17, 4, 561. ; Starzyk J. (2000), A mathematical foundation for improved reduct generation in information systems, Knowledge Informative Systems, 2, 2, 131, doi.org/10.1007/s101150050007 ; Czaja Z. (2003), Fault diagnosis in electronic circuits based on bilinear transformation in 3-D and 4-D spaces, IEEE Transactions on Instrumentation and Measurements, 52, 1, 97, doi.org/10.1109/TIM.2003.809075 ; Bandler J. (1981), Fault diagnosis of analog circuits, Proceedings of IEEE, 73, 1279, doi.org/10.1109/PROC.1985.13281 ; Jantos P. (2009), Fault diagnosis in analog electronic circuits - the SVM approach, Metrology and Measurement Systems, 16, 4, 583. ; Toczek, W. (2009). Testing and Diagnostics Strategies for Analog Electronic Circuits, <i>D. Sc. Thesis.</i> Gdańsk University of Technology. Gdańsk. (in Polish). ; Manetti S. (1990), Automatic test point selection for linear analog network fault diagnosis, Proceedings of IEEE ISCAS'90, 1, 25. ; Tadeusiewicz M. (2008), An efficient method for simulation of multiple catastrophic faults, null, 356. ; Prasad V. (2000), Selection of test nodes for analog fault diagnosis in dictionary approach, IEEE Transactions on Instrumentation and Measurement, 49, 1289, doi.org/10.1109/19.893273 ; Starzyk J. (2004), Entropy-Based Optimum Test Points Selection for Analog Fault Dictionary Techniques, IEEE Transactions on Instrumentation and Measurements, 53, 754, doi.org/10.1109/TIM.2004.827085 ; Benchmark circuits. <a target="_blank" href='http://www.eng.auburn.edu/~strouce/analogbc/BCoverview.htm'>http://www.eng.auburn.edu/~strouce/analogbc/BCoverview.htm</a> ; Logic Programming Associates Ltd. Official Web Site. <a target="_blank" href='http://www.lpa.co.uk/'>http://www.lpa.co.uk/</a> ; Reiter R. (1980), A logic for default reasoning, Artificial Intelligence, 13, 81, doi.org/10.1016/0004-3702(80)90014-4 ; Zadeh L. (2008), Is there a need for fuzzy logic?, Information Sciences, 178, 13, 2751, doi.org/10.1016/j.ins.2008.02.012 ; Miura Y. (2006), Fault Diagnosis of Analog Circuits Based on Adaptive Test and Output Characteristics, null, 410.

DOI

10.2478/v10178-011-0011-6

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