Szczegóły

Tytuł artykułu

DSPIC-Based Impedance Measuring Instrument

Tytuł czasopisma

Metrology and Measurement Systems

Rocznik

2011

Numer

No 2

Autorzy publikacji

Wydział PAN

Nauki Techniczne

Wydawca

Polish Academy of Sciences Committee on Metrology and Scientific Instrumentation

Data

2011

Identyfikator

ISSN 0860-8229

Referencje

Caetano F. (2004), Viscosity measurements of liquid toluene at low temperatures using a dual vibrating-wire technique, Int. J. Thermophys, 25, 1, 1, doi.org/10.1023/B:IJOT.0000022325.10161.39 ; Agilent 4294A Precision Impedance Analyzer. (2008). Datasheet for Agilent Technologies. <a target="_blank" href='http://www.agilent.com'>http://www.agilent.com</a> ; IEEE Std. 1057-1994. (December 1994). <i>Standard for Digitizing Waveform Records.</i> The Institute of Electrical and Electronics Engineers. New York. ; Ramos P. (2008), A new sine-fitting algorithm for accurate amplitude and phase measurements in two channel acquisition systems, Measurement, Elsevier, 41, 2, 135, doi.org/10.1016/j.measurement.2006.03.011 ; Ramos P. (2009), Recent Developments on Impedance Measurements With DSP-Based Ellipse-Fitting Algorithms, IEEE Trans. Instrum. Meas, 58, 5, 1680, doi.org/10.1109/TIM.2009.2014512 ; <i>The Impedance Measurement Handbook - A Guide to Measurement Technologies and Techniques.</i> (2000). Agilent Technologies Co. ; 3532-50 LCR HiTESTER. (2005). Datasheet for HIOKI. <a target="_blank" href='http://www.hioki.com'>http://www.hioki.com</a> ; Renders H. (1984), High-accuracy spectrum analysis of sampled discrete frequency signals by analytical leakage compensation, IEEE Trans. Instrum. Meas, 33, 287, doi.org/10.1109/TIM.1984.4315226 ; Händel P. (2008), Parameter estimation employing a dual-channel sine-wave model under a gaussian assumption, IEEE Trans. Instrum. Meas, 57, 8, 1661, doi.org/10.1109/TIM.2008.923782

DOI

10.2478/v10178-011-0002-0

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