Details

Title

DAC Testing Using Modulated Signals

Journal title

Metrology and Measurement Systems

Yearbook

2011

Numer

No 2

Publication authors

Divisions of PAS

Nauki Techniczne

Publisher

Polish Academy of Sciences Committee on Metrology and Scientific Instrumentation

Date

2011

Identifier

ISSN 0860-8229

References

DYNAD (2000). Methods and draft standards for the Dynamic characterization and Testing of Analogue to Digital Converters. <a target="_blank" href='http://paginas.fe.up.pt/~hsm/dynad/'>http://paginas.fe.up.pt/~hsm/dynad/</a> ; IEEE Standard 1241-2000. (2000). IEEE Standard and Terminology and Test Methods for Analog-to-Digital Converters. New York. ; IEEE P1658 TM/D03.6. (1988). Draft Standard for Terminology and Test Methods for Digital-to-Analog Converters. New York. ; Vedral J. (2009), Methods for economical test of dynamic parameters ADCs, Metrology and Measurement Systems, 15, 1, 161. ; Vedral J. (2008), Exponential Fit Test - Theoretical Analysis and Practically Implementation, null, 1033. ; Holcer R. (2003), DNL ADC Testing by the exponential shaped voltage, IEEE Transaction on Instrumentation and Measurement, 52, 3, 946, doi.org/10.1109/TIM.2003.814668 ; App. Note 641. (2002). ADC and DAC Glossary. <i>Sunnyvale: Maxim Integrated Products</i>, 22. ; Oppenheim A. (1989), Discrete-Time Signal Processing. ; Vedral J. (2010), Mixed-Signals, Sensors and Systems Test Workshop (IMS3TW), 1, doi.org/10.1109/IMS3TW.2010.5503120 ; Dallet D. (2005), Dynamic characterisation of analogue-to-digital converters. ; Newkirk D. (2004), The ARRL Handbook for Radio Communications. ; Boashash B. (2003), Time-Frequency Signal Analysis and Processing - A Comprehensive Reference.

DOI

10.2478/v10178-011-0010-0

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