Details

Title

Soft Fault Clustering in Analog Electronic Circuits with the Use of Self Organizing Neural Network

Journal title

Metrology and Measurement Systems

Yearbook

2011

Numer

No 4

Publication authors

Divisions of PAS

Nauki Techniczne

Publisher

Polish Academy of Sciences Committee on Metrology and Scientific Instrumentation

Date

2011

Identifier

ISSN 0860-8229

References

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(2007), Genetic-Algorithm-Based Method for Optimal Analog Test Points Selection, IEEE Trans. on Cir. and Syst.-II, 54, 2, 117, doi.org/10.1109/TCSII.2006.884112 ; Prasad V. (2000), Selection of test nodes for analog fault diagnosis in dictionary approach, IEEE Trans. Instrum. Meas, 49, 6, 1289, doi.org/10.1109/19.893273 ; Pułka A. (2011), Two Heuristic Algorithms for Test Point Selection in Analog Circuits Diagnoses, Metrology and Measurement Systems, 18, 1, 115, doi.org/10.2478/v10178-011-0011-6 ; Starzyk J. (2004), Entropy-Based Optimum Test Points Selection for Analog Fault Dictionary Techniques, IEEE Trans. on Instrumentation and Measurement, 53, 3, 754, doi.org/10.1109/TIM.2004.827085 ; Grasso F. (2007), A Method for the Automatic Selection of Test Frequencies in Analog Fault Diagnosis, IEEE Trans. on Instr. and Measur, 56, 6. ; Grzechca D. (2007), Simulated Annealing with Fuzzy Fitness Function for Test Frequencies Selection, null. ; Sen N. (1979), Fault Diagnosis for Linear Systems Via Multifrequency Measurements, IEEE Trans. On Circuits and Systems, 26, 457, doi.org/10.1109/TCS.1979.1084659 ; Chruszczyk Ł. (2007), Finding of optimal excitation signal for testing of analog electronic circuits, Bulletin of the Polish Academy of Science, 55, 3, 273. ; Golonek T. (2008), Optimization of PWL Analog testing Excitation by Means of Genetic Algorithm, null, 541. ; Hochwald W. (1979), A DC dictionary approach for analog fault dictionary determination, IEEE Trans. on Circuits and Systems, 26, 523, doi.org/10.1109/TCS.1979.1084665 ; Bilski P. (2007), Automated Diagnostics of Analog Systems Using Fuzzy Logic Approach, IEEE Trans. on Inst. and Measur, 56, 6. ; Grzechca D. (2006), Analog Fault AC Dictionary Creation - The Fuzzy Set Approach, null, 5744. ; Wang P. (2005), A New Diagnosis Approach for Handling Tolerance in Analog and Mixed-Signal Circuits by Using Fuzzy Math, IEEE Trans. on Circuits and Systems-I: Regular Papers, 53, 10. ; Zhou L. (2009), Soft Fault Diagnosis in Analog Circuit Based on Fuzzy and Direction Vector, Metrol. Meas. Syst, 16, 1, 61. ; Muhammad H. (2002), Spice for Circuits and Electronics Using Pspice. ; Tadeusiewicz M. (2011), Multiple catastrophic fault diagnosis of analog circuits considering the component tolerances, International Journal of Circuit Theory and Applications, doi.org/10.1002/cta.770 ; Toczek W. (2004), Analog fault signature based on sigma-delta modulation and oscillation-test methodology, Metrology and Measurement Systems, 11, 4, 363. ; Kuczyński A. (2009), Analog circuits diagnosis using discrete wavelet transform of supply current, Metrol. Meas. Syst, 16, 1, 77. ; Grzechca D. (2007), Wavelet - Neural Network to Analog Paramteric Fault Circuit Location, null, 2. ; Aminian F. (2007), Fault-Diagnostic System for Analog Electronic Circuit Using Neural Networks With Wavelet Transform as a Preprocessor, IEEE Trans. on Inst. and Measur, 56, 5. ; Jantos P. (2009), Global Parametric Faults identification in analog electronic circuits, Metrol. Meas. Syst, 16, 3, 391. ; Czaja Z. (2004), On fault diagnosis of analogue electronic circuits based on transformations in multidimensional spaces, Measurement, 35, 3, 293, doi.org/10.1016/j.measurement.2003.10.004 ; Tadeusiewicz M. (2006), International Journal of Circuit Theory and Applications, 607. ; Balen T. (2006), Functional Test of Field Programmable Analog Arrays, null. ; Das S. (2007), Testing Analog and Mixed-Signal Circuits With Built-In Hardware - A New Approach, IEEE Trans. On Inst. and Measur, 56, 3. ; Toczek W. (2009), Built-in test scheme for detection, classification and evaluation of nonlinearities, Metrol. Meas. Syst, 16, 1, 47. ; Grzechca D. (2009), Fault Diagnosis in Analog Electronic Circuit - the SVM approach, Metrology and Measurement Systems, 16, 4, 583. ; Rutkowski J. (1994), A two stage neural network DC fault dictionary, Circuits and Systems, 1994. ISCAS '94., 1994 IEEE International Symposium on, 6, 299, doi.org/10.1109/ISCAS.1994.409585 ; Grzechca D. (2010), PCA application to frequency reduction for fault diagnosis in analog and mixed electronic circuit, null, 1919. ; Somayajula S. (1996), Analog fault diagnosis based on ramping power supply current signature clusters, Circuits and Systems II: Analog and Digital Signal Processing, IEEE Transactions on, 43, 10, 703, doi.org/10.1109/82.539002 ; Somayajula S. (1993), Analog fault diagnosis: a fault clustering approach, null, 108. ; Collins P. (1994), Application of Kohonen and supervised forced organisation maps to fault diagnosis in CMOS opamps, Electronics Letters, 30, 22, 1846, doi.org/10.1049/el:19941281 ; Osowski S. (1998), Self-organizing neural network for fault location in electrical circuits, Electronics, Circuits and Systems, 1998 IEEE International Conference on, 2, 265. ; Grzechca D. (2011), Group of parametric failures in the amplifier with the use of ECG self-organizing neural network, null, 896. ; Kohonen T. (2000), Self Organizing Map. ; Kohonen T. (1988), Self Organization and Associative Memory. ; Mathworks, Self Organizing Map Toolbox. ; Mehotra K. (1997), Elements of Artificial Neural Networks, 187. ; Duch W. (2000), Neural networks, biocybernetics and biomedical engineering, Academic publishing house EXIT. ; Kugelstadt T. (2005), Getting the most out of your instrumentation amplifier design, Analog Applications Journal, 4.

DOI

10.2478/v10178-011-0054-8

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