Title

Analog Circuit Fault Classification Using Improved One-Against-One Support Vector Machines

Journal title

Metrology and Measurement Systems

Yearbook

2011

Numer

No 4

Publication authors

Jiang Cui ; Youren Wang

Divisions of PAS

Nauki Techniczne

Publisher

Polish Academy of Sciences Committee on Metrology and Scientific Instrumentation

Date

2011

Identifier

ISSN 0860-8229

References

Starzyk J. (2000), Finding Ambiguity Groups in Low Testability Analog Circuits, IEEE Trans. Circuits and Syst.: Fundamental Theory and Applications, 47, 8, 1125, doi.org/10.1109/81.873868 ; Wang P. (2005), A New Diagnosis Approach for Handling Tolerance in Analog and Mixed-Signal Circuits by Using Fuzzy Math, IEEE Trans. on Circuits and Systems-I: Regular Papers, 52, 10, 2118, doi.org/10.1109/TCSI.2005.853266 ; Bandler J. (1985), Fault Diagnosis of Analog Circuits, Proc. IEEE, 73, 8, 1279, doi.org/10.1109/PROC.1985.13281 ; Golonek T. (2007), Genetic-Algorithm-Based Method for Optimal Analog Test Points Selection, IEEE Trans. on Circuits and Systems-II: Express Briefs, 54, 2, 117, doi.org/10.1109/TCSII.2006.884112 ; Dimopoulos M. (2009), Wavelet Energy-based Testing Using Supply Current Measurements, IET Sci. Meas. Technol, 4, 2, 76, doi.org/10.1049/iet-smt.2009.0037 ; Catelani M. (2002), A Fuzzy Approach for Soft Fault Detection in Analog Circuits, Meas, 32, 1, 73, doi.org/10.1016/S0263-2241(01)00049-5 ; Tan Y. (2008), A Novel Method for Fault Diagnosis of Analog Circuits Based on WP and GPNN, Int. J. of Electron, 95, 5, 431, doi.org/10.1080/00207210801996139 ; Aminian M. (2002), Analog Fault Diagnosis of actual Circuits Using Neural Networks, IEEE Trans. on Instrum. Meas, 51, 3, 1546. ; El-Gamal M. (2003), Fault Isolation in Analog Circuits using A Fuzzy Inference System, Comput. Electr. Eng, 29, 1, 213, doi.org/10.1016/S0045-7906(01)00020-9 ; Grzechca D. (2009), Fault Diagnosis in Analog Electronic Circuits-The SVM Approach, Metrol. Meas. Syst, 16, 4, 583. ; Salat R. (2003), Analog Filter Diagnosis Using Support Vector Machine, null, 421. ; Siwek K. (2006), Support Vector Machine for Fault Diagnosis in Electrical Circuits, null, 342. ; Sun Y. (2006), Analog Circuits Fault Diagnosis Using Support Vector Machine, null, 1003. ; Huang K. (2010), Fault Diagnosis of Analog Circuits Based on Machine Learning, null, 1761. ; Cui J. (2011), A Novel Approach of Analog Circuit Fault Diagnosis Using Support Vector Machines Classifier, Meas, 44, 1, 281, doi.org/10.1016/j.measurement.2010.10.004 ; Cui J. (2010), A Novel Approach of Analog Fault Classification Using A Support Vector Machines Classifier, Metrol. Meas. Syst, 17, 4, 561, doi.org/10.2478/v10178-010-0046-0 ; Hsu C. (2002), A Comparison of Methods for Multi-class Support Vector Machines, IEEE Trans. on Neural Networks, 13, 2, 415, doi.org/10.1109/72.991427 ; Vapnik V. (1998), Statistical Learning Theory. ; Chapelle O. (1999), Support Vector Machines for Histogram-based Image Classification, IEEE Trans. on Neural Networks, 10, 5, 1055, doi.org/10.1109/72.788646

DOI

10.2478/v10178-011-0055-7