Details
Title
Analog Circuit Fault Classification Using Improved One-Against-One Support Vector Machines
Journal title
Metrology and Measurement Systems
Yearbook
Numer
Publication authors
Divisions of PAS
Publisher
Polish Academy of Sciences Committee on Metrology and Scientific Instrumentation
Date
Identifier
ISSN 0860-8229
References
Starzyk J. (2000), Finding Ambiguity Groups in Low Testability Analog Circuits, IEEE Trans. Circuits and Syst.: Fundamental Theory and Applications, 47, 8, 1125, doi.org/10.1109/81.873868 ; Wang P. (2005), A New Diagnosis Approach for Handling Tolerance in Analog and Mixed-Signal Circuits by Using Fuzzy Math, IEEE Trans. on Circuits and Systems-I: Regular Papers, 52, 10, 2118, doi.org/10.1109/TCSI.2005.853266 ; Bandler J. (1985), Fault Diagnosis of Analog Circuits, Proc. IEEE, 73, 8, 1279, doi.org/10.1109/PROC.1985.13281 ; Golonek T. (2007), Genetic-Algorithm-Based Method for Optimal Analog Test Points Selection, IEEE Trans. on Circuits and Systems-II: Express Briefs, 54, 2, 117, doi.org/10.1109/TCSII.2006.884112 ; Dimopoulos M. (2009), Wavelet Energy-based Testing Using Supply Current Measurements, IET Sci. Meas. Technol, 4, 2, 76, doi.org/10.1049/iet-smt.2009.0037 ; Catelani M. (2002), A Fuzzy Approach for Soft Fault Detection in Analog Circuits, Meas, 32, 1, 73, doi.org/10.1016/S0263-2241(01)00049-5 ; Tan Y. (2008), A Novel Method for Fault Diagnosis of Analog Circuits Based on WP and GPNN, Int. J. of Electron, 95, 5, 431, doi.org/10.1080/00207210801996139 ; Aminian M. (2002), Analog Fault Diagnosis of actual Circuits Using Neural Networks, IEEE Trans. on Instrum. Meas, 51, 3, 1546. ; El-Gamal M. (2003), Fault Isolation in Analog Circuits using A Fuzzy Inference System, Comput. Electr. Eng, 29, 1, 213, doi.org/10.1016/S0045-7906(01)00020-9 ; Grzechca D. (2009), Fault Diagnosis in Analog Electronic Circuits-The SVM Approach, Metrol. Meas. Syst, 16, 4, 583. ; Salat R. (2003), Analog Filter Diagnosis Using Support Vector Machine, null, 421. ; Siwek K. (2006), Support Vector Machine for Fault Diagnosis in Electrical Circuits, null, 342. ; Sun Y. (2006), Analog Circuits Fault Diagnosis Using Support Vector Machine, null, 1003. ; Huang K. (2010), Fault Diagnosis of Analog Circuits Based on Machine Learning, null, 1761. ; Cui J. (2011), A Novel Approach of Analog Circuit Fault Diagnosis Using Support Vector Machines Classifier, Meas, 44, 1, 281, doi.org/10.1016/j.measurement.2010.10.004 ; Cui J. (2010), A Novel Approach of Analog Fault Classification Using A Support Vector Machines Classifier, Metrol. Meas. Syst, 17, 4, 561, doi.org/10.2478/v10178-010-0046-0 ; Hsu C. (2002), A Comparison of Methods for Multi-class Support Vector Machines, IEEE Trans. on Neural Networks, 13, 2, 415, doi.org/10.1109/72.991427 ; Vapnik V. (1998), Statistical Learning Theory. ; Chapelle O. (1999), Support Vector Machines for Histogram-based Image Classification, IEEE Trans. on Neural Networks, 10, 5, 1055, doi.org/10.1109/72.788646
DOI
10.2478/v10178-011-0055-7