Details

Title

Ultrasonic Spectroscopy of Silicon Single Crystal

Journal title

Metrology and Measurement Systems

Yearbook

2011

Numer

No 4

Publication authors

Divisions of PAS

Nauki Techniczne

Publisher

Polish Academy of Sciences Committee on Metrology and Scientific Instrumentation

Date

2011

Identifier

ISSN 0860-8229

References

Hajek K. (2007), The improved system for electro-ultrasonic nonlinear spectroscopy, null, 71. ; Migliori A. (1997), Resonant Ultrasound Spectroscopy. ; Sedlakova V. (2008), Electro-ultrasonic spectroscopy of polymer based thick film layers, Microelectronics Reliability, 48, 6, 886, doi.org/10.1016/j.microrel.2008.03.011 ; Sedlakova V. (2007), Electro-ultrasonic spectroscopy of conducting solids, null, 523. ; Hasse L. (2009), Quality assessment of varistor ZnO structures by resonant ultrasound spectroscopy, Insight, 51, 5, 262, doi.org/10.1784/insi.2009.51.5.262 ; Kim Y. (2010), Feasible study on electro-ultrasonic spectroscopy of silicon single crystal, null, 301. ; Sikula J. (2008), Improved Signal to Noise Ratio of Electro-ultrasonic Spectroscopy, ElectroScope, 2, 6, 1. ; Hajek K. (2004), Improving the practical sensitivity of nonlinear ultrasound spectroscopy for one exciting signal, null, 51. ; Tofel P. (2009), NDT of single crystal CdTe and Si by electro-ultrasonic spectroscopy, null, 305. ; Hopcroft M. (2010), What is the Young's Modulus of Silicon?, Journal of Micro-electromechanical Systems, 19, 229.

DOI

10.2478/v10178-011-0059-3

×