Details
Title
Noise Measurements Of Resistors With The Use Of Dual-Phase Virtual Lock-In TechniqueJournal title
Metrology and Measurement SystemsYearbook
2015Volume
vol. 22Numer
No 4Authors
Keywords
1/f noise ; polymer thick-film resistor ; low-frequency noise measurements ; virtual lock-inDivisions of PAS
Nauki TechniczneCoverage
503-512Publisher
Polish Academy of Sciences Committee on Metrology and Scientific InstrumentationDate
2015[2015.01.01 AD - 2015.12.31 AD]Type
Artykuły / ArticlesIdentifier
ISSN 0860-8229DOI
10.1515/mms-2015-0051