Details

Title

Measurement of Silver Nanolayer Absorption by the Body in an in Vivo Model of Inflammatory Gastrointestinal Diseases

Journal title

Metrology and Measurement Systems

Yearbook

2016

Volume

vol. 23

Numer

No 1

Publication authors

Divisions of PAS

Nauki Techniczne

Publisher

Polish Academy of Sciences Committee on Metrology and Scientific Instrumentation

Date

2016

Identifier

ISSN 0860-8229

References

Powell (2006), Distinguishability of N composition profiles in SiON films on Si by angle - resolved x - ray photoelectron spectroscopy, Appl Phys Lett, 89. ; Conard (2012), Thin layer composition profiling with angular resolved x - ray photoemission spectroscopy : Factors affecting quantitative results of, Journal Vacuum Science Technology A, 30, doi.org/10.1116/1.4704603 ; Witte (2003), de Ion - bombardment artifact in TOF - SIMS analysis of ZrO SiO Si stacks, Appl Surf Sci, 21, 203. ; Douglas (2000), Depth Profile Analysis of Ultrathin Silicon Oxynitride Films by TOFSIMS, Electrochem Soc, 147. ; Losurdo (2009), de Spectroscopic ellipsometry and polarimetry for materials and systems analysis at the nanometer scale : state - of - the - art potential and perspectives, Nanopart Res, 11. ; Herrera (2009), Report on the th IUVSTA Workshop Angle - Resolved XPS : The Current Status and Future Prospects for Angle - resolved XPS of Nano and Subnano Films, Surf Interface Anal, 41. ; Ge (2014), Nanosilver particles in medical applications : synthesis performance and toxicity, Int J Nanomedicine, 1, 9. ; Conard (2004), de van Nitrogen analysis in high - k stack layers : a challenge, Appl Surf Sci, 231. ; Brijs (2000), Characterization of ultra thin oxynitrides : A general approach, Nucl Instrum Methods Phys Res, 161. ; Gibaud (2000), ray relectivity and diffuse scaterring, Current Science, 78, 1467. ; Brundle (2010), XPS and angle resolved XPS in the semiconductor industry Characterization and metrology control of ultra - thin films, Electron Spectrosc Relat Phenom, 178. ; Berkum (2003), van Quantitative depth profiling of SiOxNy layers on Si, Appl Surf Sci, 20, 203. ; Dollinger (1998), Depth profile analysis with monolayer resolution using elastic recoil detection, Europhys Lett, 14, 42. ; Schaub (2013), Gold nanolayer and nanocluster coatings induced by heat treatment and evaporation technique, Nanoscale Research Letters, 8. ; Halimaoui (1998), Tailoring of the Nitrogen Profile in Thin Gate Oxides Using Substrate Nitridation by Nitric Oxide, MRS Proceedings, 11, 532. ; Danzebrink (2006), Advances in Scanning Force Microscopy for Dimensional Metrology, CIRP Annals Manufacturing Technology, 55. ; Chen (2008), Nanosilver : a nanoproduct in medical application, Toxicol Lett, 176. ; Sobczak (2014), Anti - inflammatory and antinociceptive action of an orally available nociceptin receptor agonist SCH in a mouse model of inflammatory bowel diseases, Pharmacol Exp Ther, 27, 348. ; Vandervorst (2004), de On the reliability of SIMS depth profiles through HfO stacks, Appl Surf Sci, 231. ; Lu (1997), SiO film thickness metrology by x - ray photoelectron spectroscopy, Appl Phys Lett, 71. ; Bennett (2004), Sputter rate variations in silicon under high - k dielectric films, Appl Surf Sci, 231. ; Boosalis (1987), Serum and urinary silver levels in thermal injury patients, Surgery, 101. ; Hunt (2014), Bioactivity of nanosilver in Caenorhabditis elegans : Effects of size coat and shape, Toxicology Reports, 1.

DOI

10.1515/mms-2016-0008

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