Details

Title

Measurement of Silver Nanolayer Absorption by the Body in an in Vivo Model of Inflammatory Gastrointestinal Diseases

Journal title

Metrology and Measurement Systems

Yearbook

2016

Numer

No 1

Publication authors

Divisions of PAS

Nauki Techniczne

Publisher

Polish Academy of Sciences Committee on Metrology and Scientific Instrumentation

Date

2016

Identifier

ISSN 0860-8229

References

Powell (2006), Distinguishability of N composition profiles in SiON films on Si by angle - resolved x - ray photoelectron spectroscopy, Appl Phys Lett, 89. ; Conard (2012), Thin layer composition profiling with angular resolved x - ray photoemission spectroscopy : Factors affecting quantitative results of, Journal Vacuum Science Technology A, 30, doi.org/10.1116/1.4704603 ; Witte (2003), de Ion - bombardment artifact in TOF - SIMS analysis of ZrO SiO Si stacks, Appl Surf Sci, 21, 203. ; Douglas (2000), Depth Profile Analysis of Ultrathin Silicon Oxynitride Films by TOFSIMS, Electrochem Soc, 147. ; Losurdo (2009), de Spectroscopic ellipsometry and polarimetry for materials and systems analysis at the nanometer scale : state - of - the - art potential and perspectives, Nanopart Res, 11. ; Herrera (2009), Report on the th IUVSTA Workshop Angle - Resolved XPS : The Current Status and Future Prospects for Angle - resolved XPS of Nano and Subnano Films, Surf Interface Anal, 41. ; Ge (2014), Nanosilver particles in medical applications : synthesis performance and toxicity, Int J Nanomedicine, 1, 9. ; Conard (2004), de van Nitrogen analysis in high - k stack layers : a challenge, Appl Surf Sci, 231. ; Brijs (2000), Characterization of ultra thin oxynitrides : A general approach, Nucl Instrum Methods Phys Res, 161. ; Gibaud (2000), ray relectivity and diffuse scaterring, Current Science, 78, 1467. ; Brundle (2010), XPS and angle resolved XPS in the semiconductor industry Characterization and metrology control of ultra - thin films, Electron Spectrosc Relat Phenom, 178. ; Berkum (2003), van Quantitative depth profiling of SiOxNy layers on Si, Appl Surf Sci, 20, 203. ; Dollinger (1998), Depth profile analysis with monolayer resolution using elastic recoil detection, Europhys Lett, 14, 42. ; Schaub (2013), Gold nanolayer and nanocluster coatings induced by heat treatment and evaporation technique, Nanoscale Research Letters, 8. ; Halimaoui (1998), Tailoring of the Nitrogen Profile in Thin Gate Oxides Using Substrate Nitridation by Nitric Oxide, MRS Proceedings, 11, 532. ; Danzebrink (2006), Advances in Scanning Force Microscopy for Dimensional Metrology, CIRP Annals Manufacturing Technology, 55. ; Chen (2008), Nanosilver : a nanoproduct in medical application, Toxicol Lett, 176. ; Sobczak (2014), Anti - inflammatory and antinociceptive action of an orally available nociceptin receptor agonist SCH in a mouse model of inflammatory bowel diseases, Pharmacol Exp Ther, 27, 348. ; Vandervorst (2004), de On the reliability of SIMS depth profiles through HfO stacks, Appl Surf Sci, 231. ; Lu (1997), SiO film thickness metrology by x - ray photoelectron spectroscopy, Appl Phys Lett, 71. ; Bennett (2004), Sputter rate variations in silicon under high - k dielectric films, Appl Surf Sci, 231. ; Boosalis (1987), Serum and urinary silver levels in thermal injury patients, Surgery, 101. ; Hunt (2014), Bioactivity of nanosilver in Caenorhabditis elegans : Effects of size coat and shape, Toxicology Reports, 1.

DOI

10.1515/mms-2016-0008

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