Details

Title

Diagnosis of Soft Spot Short Defects in Analog Circuits Considering the Thermal Behaviour of the Chip

Journal title

Metrology and Measurement Systems

Yearbook

2016

Volume

vol. 23

Numer

No 2

Publication authors

Divisions of PAS

Nauki Techniczne

Publisher

Polish Academy of Sciences Committee on Metrology and Scientific Instrumentation

Date

2016

Identifier

ISSN 0860-8229

References

Tadeusiewicz (2015), A new approach to multiple soft fault diagnosis of analog BJT and CMOS circuits, IEEE Trans Instr, 64, 2688, doi.org/10.1109/TIM.2015.2421712 ; Gizopoulos (2006), Advances in electronic testing Challenges and methodologies, Dordrecht. ; Czaja (2013), Self - testing of analog parts terminated by ADCs based on multiple sampling of time response, IEEE Trans Instrum, 62, 3160, doi.org/10.1109/TIM.2013.2272867 ; Maly (1986), VLSI yield prediction and estimation : a unified framework - Aided Des, IEEE Trans Comput Integr Cir Syst, 5, 114, doi.org/10.1109/TCAD.1986.1270182 ; El (2007), Ensembles of neural networks for fault diagnosis in analog circuits, J Electron Test, 23, 323, doi.org/10.1007/s10836-006-0710-1 ; Huang (2012), Diagnosis of local spot defect is analog circuits, IEEE Trans Instrum, 61, 2701, doi.org/10.1109/TIM.2012.2196390 ; Kabisatpathy (2005), Fault diagnosis of analog integrated circuits, Dordrecht. ; Kim (1997), A novel test technique for MCM substrates, IEEE Trans Comp Manufact Technol, 20. ; Tadeusiewicz (2002), An algorithm for soft - fault diagnosis of linear and nonlinear circuits, IEEE Trans Cir Syst, 1648, doi.org/10.1109/TCSI.2002.804596 ; Tadeusiewicz (2015), Catastrophic fault diagnosis of a certain class of nonlinear analog circuits, Cir Syst Signal Process, 34, 335. ; Long (2013), Diagnostics of analog circuits based on LS - SVM using time domain features, Cir Syst Signal Process, 32, 2683, doi.org/10.1007/s00034-013-9614-3 ; Tadeusiewicz (2012), Multiple catastrophic fault diagnosis of analog circuits considering the component tolerances, Int J Cir Theor Appl, 40, 1041, doi.org/10.1002/cta.770 ; Gyvez (1992), IC defect sensitivity for footprint - type spot defect - Aided Design Integr, IEEE Trans Comput Cir Syst, 11, 638. ; Grzechca (2009), Fault diagnosis in analog electronic circuits - the SVM approach, Metrol Meas Syst, 16, 583. ; Robotycki (2002), Fault diagnosis of analog piecewise linear circuits based on homotopy, IEEE Trans Instrum, 51, 876, doi.org/10.1109/TIM.2002.803515 ; Rodrigez (2002), de Resistance characterization for weak open defects IEEE Des, Test Comput, 19, 18, doi.org/10.1109/MDT.2002.1033788 ; Aminian (2007), A modular fault - diagnosis system for analog electronic circuits using neural networks with wavelet transform as a preprocessor, IEEE Trans, 56, 1546. ; Catelani (2002), Soft fault detection and isolation in analog circuits : some results and a comparison between a fuzzy approach and radial basis function networks, IEEE Trans Instrum, 51, 196, doi.org/10.1109/19.997811

DOI

10.1515/mms-2016-0023

×