Szczegóły

Tytuł artykułu

Diagnosis of Soft Spot Short Defects in Analog Circuits Considering the Thermal Behaviour of the Chip

Tytuł czasopisma

Metrology and Measurement Systems

Rocznik

2016

Numer

No 2

Autorzy publikacji

Wydział PAN

Nauki Techniczne

Wydawca

Polish Academy of Sciences Committee on Metrology and Scientific Instrumentation

Data

2016

Identyfikator

ISSN 0860-8229

Referencje

Tadeusiewicz (2015), A new approach to multiple soft fault diagnosis of analog BJT and CMOS circuits, IEEE Trans Instr, 64, 2688, doi.org/10.1109/TIM.2015.2421712 ; Gizopoulos (2006), Advances in electronic testing Challenges and methodologies, Dordrecht. ; Czaja (2013), Self - testing of analog parts terminated by ADCs based on multiple sampling of time response, IEEE Trans Instrum, 62, 3160, doi.org/10.1109/TIM.2013.2272867 ; Maly (1986), VLSI yield prediction and estimation : a unified framework - Aided Des, IEEE Trans Comput Integr Cir Syst, 5, 114, doi.org/10.1109/TCAD.1986.1270182 ; El (2007), Ensembles of neural networks for fault diagnosis in analog circuits, J Electron Test, 23, 323, doi.org/10.1007/s10836-006-0710-1 ; Huang (2012), Diagnosis of local spot defect is analog circuits, IEEE Trans Instrum, 61, 2701, doi.org/10.1109/TIM.2012.2196390 ; Kabisatpathy (2005), Fault diagnosis of analog integrated circuits, Dordrecht. ; Kim (1997), A novel test technique for MCM substrates, IEEE Trans Comp Manufact Technol, 20. ; Tadeusiewicz (2002), An algorithm for soft - fault diagnosis of linear and nonlinear circuits, IEEE Trans Cir Syst, 1648, doi.org/10.1109/TCSI.2002.804596 ; Tadeusiewicz (2015), Catastrophic fault diagnosis of a certain class of nonlinear analog circuits, Cir Syst Signal Process, 34, 335. ; Long (2013), Diagnostics of analog circuits based on LS - SVM using time domain features, Cir Syst Signal Process, 32, 2683, doi.org/10.1007/s00034-013-9614-3 ; Tadeusiewicz (2012), Multiple catastrophic fault diagnosis of analog circuits considering the component tolerances, Int J Cir Theor Appl, 40, 1041, doi.org/10.1002/cta.770 ; Gyvez (1992), IC defect sensitivity for footprint - type spot defect - Aided Design Integr, IEEE Trans Comput Cir Syst, 11, 638. ; Grzechca (2009), Fault diagnosis in analog electronic circuits - the SVM approach, Metrol Meas Syst, 16, 583. ; Robotycki (2002), Fault diagnosis of analog piecewise linear circuits based on homotopy, IEEE Trans Instrum, 51, 876, doi.org/10.1109/TIM.2002.803515 ; Rodrigez (2002), de Resistance characterization for weak open defects IEEE Des, Test Comput, 19, 18, doi.org/10.1109/MDT.2002.1033788 ; Aminian (2007), A modular fault - diagnosis system for analog electronic circuits using neural networks with wavelet transform as a preprocessor, IEEE Trans, 56, 1546. ; Catelani (2002), Soft fault detection and isolation in analog circuits : some results and a comparison between a fuzzy approach and radial basis function networks, IEEE Trans Instrum, 51, 196, doi.org/10.1109/19.997811

DOI

10.1515/mms-2016-0023

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