Szczegóły

Tytuł artykułu

Diagnosis of Soft Spot Short Defects in Analog Circuits Considering the Thermal Behaviour of the Chip

Tytuł czasopisma

Metrology and Measurement Systems

Rocznik

2016

Wolumin

vol. 23

Numer

No 2

Autorzy publikacji

Wydział PAN

Nauki Techniczne

Wydawca

Polish Academy of Sciences Committee on Metrology and Scientific Instrumentation

Data

2016

Identyfikator

ISSN 0860-8229

Referencje

Tadeusiewicz (2015), A new approach to multiple soft fault diagnosis of analog BJT and CMOS circuits, IEEE Trans Instr, 64, 2688, doi.org/10.1109/TIM.2015.2421712 ; Gizopoulos (2006), Advances in electronic testing Challenges and methodologies, Dordrecht. ; Czaja (2013), Self - testing of analog parts terminated by ADCs based on multiple sampling of time response, IEEE Trans Instrum, 62, 3160, doi.org/10.1109/TIM.2013.2272867 ; Maly (1986), VLSI yield prediction and estimation : a unified framework - Aided Des, IEEE Trans Comput Integr Cir Syst, 5, 114, doi.org/10.1109/TCAD.1986.1270182 ; El (2007), Ensembles of neural networks for fault diagnosis in analog circuits, J Electron Test, 23, 323, doi.org/10.1007/s10836-006-0710-1 ; Huang (2012), Diagnosis of local spot defect is analog circuits, IEEE Trans Instrum, 61, 2701, doi.org/10.1109/TIM.2012.2196390 ; Kabisatpathy (2005), Fault diagnosis of analog integrated circuits, Dordrecht. ; Kim (1997), A novel test technique for MCM substrates, IEEE Trans Comp Manufact Technol, 20. ; Tadeusiewicz (2002), An algorithm for soft - fault diagnosis of linear and nonlinear circuits, IEEE Trans Cir Syst, 1648, doi.org/10.1109/TCSI.2002.804596 ; Tadeusiewicz (2015), Catastrophic fault diagnosis of a certain class of nonlinear analog circuits, Cir Syst Signal Process, 34, 335. ; Long (2013), Diagnostics of analog circuits based on LS - SVM using time domain features, Cir Syst Signal Process, 32, 2683, doi.org/10.1007/s00034-013-9614-3 ; Tadeusiewicz (2012), Multiple catastrophic fault diagnosis of analog circuits considering the component tolerances, Int J Cir Theor Appl, 40, 1041, doi.org/10.1002/cta.770 ; Gyvez (1992), IC defect sensitivity for footprint - type spot defect - Aided Design Integr, IEEE Trans Comput Cir Syst, 11, 638. ; Grzechca (2009), Fault diagnosis in analog electronic circuits - the SVM approach, Metrol Meas Syst, 16, 583. ; Robotycki (2002), Fault diagnosis of analog piecewise linear circuits based on homotopy, IEEE Trans Instrum, 51, 876, doi.org/10.1109/TIM.2002.803515 ; Rodrigez (2002), de Resistance characterization for weak open defects IEEE Des, Test Comput, 19, 18, doi.org/10.1109/MDT.2002.1033788 ; Aminian (2007), A modular fault - diagnosis system for analog electronic circuits using neural networks with wavelet transform as a preprocessor, IEEE Trans, 56, 1546. ; Catelani (2002), Soft fault detection and isolation in analog circuits : some results and a comparison between a fuzzy approach and radial basis function networks, IEEE Trans Instrum, 51, 196, doi.org/10.1109/19.997811

DOI

10.1515/mms-2016-0023

×