Szczegóły

Tytuł artykułu

The Study of Selected Properties of Ti EB PVD Coating Deposited Onto Inner Tube Surface at Low Temperature

Tytuł czasopisma

Archives of Metallurgy and Materials

Rocznik

2016

Numer

No 1 March

Autorzy publikacji

Wydział PAN

Nauki Techniczne

Wydawca

Institute of Metallurgy and Materials Science of Polish Academy of Sciences ; Commitee on Metallurgy of Polish Academy of Sciences

Data

2016

Identyfikator

ISSN 1733-3490

Referencje

Boxman (2006), Vacuum arc deposition devices, Rev Sci Instrum, 77. ; Voevodin (1997), Design of a Ti / TiC / DLC functionally gradient coating based on studies of structural transitions in Ti - C thin films Thin Solid, Films, 14, 298. ; Chu (2008), Structural and mechanical properties of titanium and titanium diboride monolayers and Ti multilayers Thin Solid, Films, 2. ; Chelliah (2009), Synergy between tribo - oxidation and strain rate response on governing the dry sliding wear behaviour of titanium, Wear, 266. ; Randall (1997), Finer particle size allows better coating characterisation with the Calotest Applications bulletin Dokument AB No CSM Instruments Advanced Mechanical Surface Testing, October, 5. ; Matthews (1985), Problems in the physical vapour deposition of titanium nitride Thin Solid, Films, 126. ; Miyoshi (1999), Sliding wear and fretting wear of diamond like carbon - based functionally graded nanocomposite coatings, Wear, 15, 225. ; Vassallo (2013), Titanium interlayer to improve the adhesion of multilayer amorphous boron carbide coating on silicon substrate Applied Surface, Science, 266. ; Kataria (2010), Tribological and deformation behaviour of titanium coating under different sliding contact conditions, Wear, 269. ; Messier (1984), Revised structure zone model for thin film physical structure, Sci Technol, 2. ; Jamal (1980), Friction and Adhesive Wear of Titanium Carbide and Titanium Nitride Overlay Coatings Thin Solid, Films, 73. ; Xu (2003), Structure hardness and elastic modulus of Pd / Ti nanostructured multilayer films Nov, Sci Technol, 21.

DOI

10.1515/amm-2016-0016

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