Szczegóły

Tytuł artykułu

An Adaptive Synthesis Calibration Method for Time-Interleaved Sampling Systems

Tytuł czasopisma

Metrology and Measurement Systems

Rocznik

2010

Numer

No 3

Autorzy

Wydział PAN

Nauki Techniczne

Wydawca

Polish Academy of Sciences Committee on Metrology and Scientific Instrumentation

Data

2010

Identyfikator

ISSN 0860-8229

Referencje

Mitra S. (1991), Analysis of mismatch effects among A/D converters in a time-interleaved waveform digitizer, IEEE Trans. Instrum. Meas, 40, 5, 831. ; Vogel C. (2005), Spectral shaping of timing mismatches in time-interleaved analog-to-digital converters, ISCAS, 1394. ; Knapp C. (1976), The generalized correlation method for estimation of time delay, IEEE Trans Acoust Speech Signal Proces, ASSP-24, 320. ; Jenq Y. (1990), Digital spectra of nonuniformly sampled signals: a robust sampling time offset estimation algorithm for ultra high-speed waveform digitizers using interleaving, IEEE Trans. Instrum. Meas, 39, 1, 71. ; Eklund J. (2000), Digital offset compensation of time-interleaved ADC using random chopper sampling, ISCAS, 3, 447. ; Jamal S. (2002), A 10-b 120-Msample/s time-interleaved analog-to-digital converter with digital background calibration, IEEE J. Solid-State Circ, 37, 1618. ; So H. (1994), A new algorithm for explicit adaptation of time delay, IEEE Trans. Signal Proces, 42, 7, 1816. ; Fu D. (1998), A digital background calibration technique for time-interleaved analog-to-digital converters, IEEE J. Solid-State Circ, 33, 1904. ; Ndjountche T. (2001), Adaptive calibration techniques for time-interleaved ADCs, Electronic Letter, 37, 412. ; Jian L. (1998), An efficient algorithm for time delay estimation, IEEE Trans. Signal Proces, 46, 8, 2231. ; Juha Y. (2006), Multiplier-free polynomial-based FIR filters with an adjustable fractional delay, IEEE Trans. Circ., Syst., Signal Proces, 25, 2, 265. ; Coleman T. (1999), Optimization Toolbox User's Guide Version 2, 282. ; <a target="_blank" href='http://www.analog.com/en/analog-to-digital-converters/ad-converter/products/evaluation-boardstools/CU__ADIsimADC__evaluation__tools/resources/fca.html'>http://www.analog.com/en/analog-to-digital-converters/ad-converter/products/evaluation-boardstools/CU__ADIsimADC__evaluation__tools/resources/fca.html</a> ; Alegria F. (2009), Study of the Random Noise Test of Analog-to-Digital Converters, Metrol. Meas. Syst, XVI, 4, 545.

DOI

10.2478/v10178-010-0034-4

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