Szczegóły

Tytuł artykułu

Leakage Current Degradation Due to Ion Drift and Diffusion in Tantalum and Niobium Oxide Capacitors

Tytuł czasopisma

Metrology and Measurement Systems

Rocznik

2017

Wolumin

vol. 24

Numer

No 2

Autorzy

Wydział PAN

Nauki Techniczne

Wydawca

Polish Academy of Sciences Committee on Metrology and Scientific Instrumentation

Data

2017

Identyfikator

ISSN 0860-8229

Referencje

Elhadidy (2015), Ion electromigration in CdTe Schottky metal - semiconductor - metal structure, Solid State Ionics, 278. ; Laleko (1982), Ionic current and kinetics of activation of the conductivity of anodic oxide films on tantalum in strong electric fields, Soviet Electrochemistry, 18, 743. ; Teverovsky (2010), Degradation of leakage currents in solid tantalum capacitors under steady - state bias conditions Electronic Components and Technology th, Conference Proc, 752. ; Smulko (2011), Acoustic emission for detecting deterioration of capacitors under aging, Microelectronics Reliability, 51, 621. ; Szewczyk (2016), Voltage Dependence of Supercapacitor Capacitance, Metrol Meas Syst, 23, 403. ; Pavelka (2002), Noise and transport characterisation of tantalum capacitors, Microelectronics Reliability, 42, 841. ; Smulko (2012), Quality testing methods of foil - based capacitors, Microelectronics Reliability, 52, 603. ; Chaneliere (1998), Tantalum pentoxide thin films for advanced dielectric applications Material and, Science Eng, 269. ; Sedlakova (2016), Supercapacitor Degradation Assesment by Power Cycling and Calendar Life Tests, Metrol Meas Syst, 23, 345.

DOI

10.1515/mms-2017-0034

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