Details

Title

Advanced Real-time Evaluation and Data Quality Monitoring Model Integration with FPGAs for Tokamak High-performance Soft X-ray Diagnostic System

Journal title

International Journal of Electronics and Telecommunications

Yearbook

2018

Volume

vol. 64

Numer

No 4

Authors

Keywords

data quality monitoring ; system modeling ; FPGA ; Verilog/VHDL ; HDL ; GEM detector ; SXR plasma diagnostics ; modular measurement system ; data evaluation

Divisions of PAS

Nauki Techniczne

Coverage

473-479

Publisher

Polish Academy of Sciences Committee of Electronics and Telecommunications

Date

2018.11.15

Type

Artykuły / Articles

Identifier

ISSN 2081-8491 (until 2012) ; eISSN 2300-1933 (since 2013)

DOI

10.24425/123548

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