Details

Title

Distribution of potential barrier height local values at Al-SiO2 and Si-SiO2 interfaces of the metal-oxide-semiconductor structures

Journal title

Bulletin of the Polish Academy of Sciences: Technical Sciences

Yearbook

2006

Volume

vol. 54

Numer

No 4

Authors

Keywords

barrier height ; effective contact potential difference ; MOS system

Divisions of PAS

Nauki Techniczne

Coverage

461-468

Date

2006

Type

Artykuły / Articles
×