Details

Title

Ion etching of HgCdTe: Properties, patterns and use as a method for defect studies

Journal title

Opto-Electronics Review

Yearbook

2017

Volume

vol. 25

Numer

No 2

Authors

Keywords

HgCdTe ; Ion etching ; Photodetectors ; Defects ; Doping

Divisions of PAS

Nauki Techniczne

Coverage

148-170

Publisher

Association of Polish Electrical Engineering and Polish Academy of Sciences in cooperation with Military University of Technology

Date

29.04.2017

Type

Article

Identifier

ISSN 1896-3757
×