Tytuł artykułu

The implementation and the performance analysis of the multi-channel software-based lock-in amplifier for the stiffness mapping with atomic force microscope (AFM)

Tytuł czasopisma

Bulletin of the Polish Academy of Sciences: Technical Sciences




No 1 March

Autorzy publikacji

Wydział PAN

Nauki Techniczne


Polish Academy of Sciences




ISSN 0239-7528, eISSN 2300-1917


Binnig G. (1986), Atomic force microscope, Phys. Rev. Lett, 56, 930, ; A. San Paulo (2002), Unifying theory of tapping-mode atomic-force microscopy, Physical Rev. B, 66, 041406, ; Giessibl F. (2005), AFM's path to atomic resolution, Materials Today, 8, 5, 32, ; A-Hassan E. (1998), Relative microelastic mapping of living cells by atomic force microscopy, Biophys. J, 74, 1564, ; Maivald P. (1991), Using force modulation to image surface elasticities with the atomic force microscope, Nanotechnology, 2, 103, ; Sahin O. (2007), An atomic force microscope tip designed to measure time-varying nanomechanical forces, Nature Nanotechnology, 2, 507, ; <i>HarmoniX User Guide</i>, doc. no 004-1024-000, Veeco Instruments Inc., Santa Barbara, 2008. ; Garcia R. (2002), Dynamic atomic force microscopy methods, Surf. Sci. Rep, 47, 197, ; Garcia R. (1999), Attractive and repulsive tip-sample interaction regimes in tapping-mode atomic force microscopy, Physical Review B, 60, 7, 4961, ; A. San Palo (2001), Tip-surface forces, amplitude and energy dissipation in amplitude modulation (tapping mode) force microscopy, Physical Review B, 64, 19, 193411, ; Derjaguin B. (1975), Effect of contact deformations on the adhesion of particles, J. Colloid Interface Sci, 53, 314, ; Sahin O. (2008), High-resolution and large dynamic range nanomechanical mapping in tapping-mode atomic force microscopy, Nanotechnology, 19, 445717, ; Sahin O. (2004), Resonant harmonic response in tapping-mode atomic force microscopy, Physical Review B, 69, 165416, ; Sahin O. (2008), Time-varying tip-sample force measurements and steady-state dynamics in tapping-mode atomic force microscopy, Physical Review B, 77, 115405, ; Sahin O. (2004), High reduction imaging of elastic properties using harmonic cantilevers, Sensors and Actuators A, 114, 183, ; O. Sahin, A. Atalar, C. F. Quate, and O. Solgaard, "Harmonic cantilevers and imaging methods for atomic force microscopy", <i>US Patent</i> No. US6935167 (2005). ; Sikora A. (2010), System of advanced signal analysis to measure mechanical properties of surfaces in AFM, Electrotechnical Review R, 86, 207. ; Sikora A. (2011), Mapping of mechanical properties of the surface by utilization of torsional oscillation of the cantilever in atomic force microscopy, Central Eur. J. Physics, 9, 2, 372, ; Sikora A. (2011), Utilization of AFM mapping of surface's mechanical properties in diagnostics of the materials for electrotechnics, Proc. Electrotechnical Institute, 253, 15. ; Sikora A. (2012), The AFM diagnostics of the graphene-based quantum hall devices, Micron, 43, 479, ; Min-Allah N. (2012), Power efficient rate monotonic scheduling for multi-core systems, J. Parallel and Distributed Computing, 72, 1, 48, ; Sułek W. (2011), Pipeline processing in low-density parity-check codes hardware decoder, Bull. Pol. Ac.: Tech, 59, 2, 149. ; Ino F. (2012), Cooperative multitasking for GPU-accelerated grid systems, Concurrency Computation Practice and Experience, 24, 1, 96, ; Legleiter J. (2006), Scanning probe acceleration microscopy (SPAM) in fluids: Mapping mechanical properties of surfaces at the nanoscale, P. Natl. Acad. Sci. USA, 103, 4813,