Evolutionary computing and algorithms are well known tools of optimisation that are utilized for various areas of analogue electronic circuits design and diagnosis. This paper presents the possibility of using two evolutionary algorithms - genetic algorithm and evolutionary strategies - for the purpose of analogue circuits yield and cost optimisation. Terms: technologic and parametric yield are defined. Procedures of parametric yield optimisation, such as a design centring, a design tolerancing, a design centring with tolerancing, are introduced. Basics of genetic algorithm and evolutionary strategies are presented, differences between these two algorithms are highlighted, certain aspects of implementation are discussed. Effectiveness of both algorithms in parametric yield optimisation has been tested on several examples and results have been presented. A share of evolutionary algorithms computation cost in a total optimisation cost is analyzed.
This article presents combined approach to analog electronic circuits testing by means of evolutionary methods (genetic algorithms) and using some aspects of information theory utilisation and wavelet transformation. Purpose is to find optimal excitation signal, which maximises probability of fault detection and location. This paper focuses on most difficult case where very few (usually only input and output) nodes of integrated circuit under test are available.
This paper presents methods for optimal test frequencies search with the use of heuristic approaches. It includes a short summary of the analogue circuits fault diagnosis and brief introductions to the soft computing techniques like evolutionary computation and the fuzzy set theory. The reduction of both, test time and signal complexity are the main goals of developed methods. At the before test stage, a heuristic engine is applied for the principal frequency search. The methods produce a frequency set which can be used in the SBT diagnosis procedure. At the after test stage, only a few frequencies can be assembled instead of full amplitude response characteristic. There are ambiguity sets provided to avoid a fault tolerance masking effect.