In the paper a new implementation of a compact smart resistive sensor based on a microcontroller with internal ADCs is proposed and analysed. The solution is based only on a (already existing in the system) microcontroller and a simple sensor interface circuit working as a voltage divider consisting of a reference resistor and a resistive sensor connected in parallel with an interference suppression capacitor. The measurement method is based on stimulation of the sensor interface circuit by a single square voltage pulse and on sampling the resulting voltage on the resistive sensor. The proposed solution is illustrated by a complete application of the compact smart resistive sensor used for temperature measurements, based on an 8-bit ATxmega32A4 microcontroller with a 12-bit ADC and a Pt100 resistive sensor. The results of experimental research confirm that the compact smart resistive sensor has 1°C resolution of temperature measurement for the whole range of changes of measured temperatures.
The error reduction technique, based on inverse transformation, for a shunt active resistance measurement using an ammeter and voltmeter is considered. When computing a corrected reading only multiplicative operations on two measurement results are used, namely squaring and division. The proposed method allows to increase re-sistance measurement accuracy by about two orders of magnitude what has been validated by both theoretical and experimental outcomes.
In this paper a measurement system for determination of supercapacitor equivalent parameters is proposed. Specific properties of materials used for supercapacitor construction require some advanced tools and measurement procedures to be applied during tests. The measurement system allows to measure values of equivalent parameters by both the DC and AC method whilst keeping appropriate time criteria required by this type of devices. Furthermore, in this paper the most relevant properties and measurement capabilities of the proposed system are described as well as some exemplary values of the supercapacitor equivalent parameters measured experimentally are presented.
Studies of electrical properties, including noise properties, of thick-film resistors prepared from various resistive and conductive materials on LTCC substrates have been described. Experiments have been carried out in the temperature range from 300 K up to 650 K using two methods, i.e. measuring (i) spectra of voltage fluctuations observed on the studied samples and (ii) the current noise index by a standard meter, both at constant temperature and during a temperature sweep with a slow rate. The 1/f noise component caused by resistance fluctuations occurred to be dominant in the entire range of temperature. The dependence of the noise intensity on temperature revealed that a temperature change from 300 K to 650 K causes a rise in magnitude of the noise intensity approximately one order of magnitude. Using the experimental data, the parameters describing noise properties of the used materials have been calculated and compared to the properties of other previously studied thick-film materials.