The paper presents the use of visual evoked potentials VEP to the objective assessment of visual acuity. Methods of using visual evoked potentials (VEP) rely on the assessment of changes of the electrical action potentials generated within the cortex. To diagnose the degree of weakening eyesight a series of studies on healthy people and visually impaired ones were made. Electrophysiological studies of the eye, using noninvasive VEP examination allow a noninvasive and objective assessment of visual acuity. The use of visual evoked potentials gives the objectivity in assessment of visual acuity what may be very important in ophthalmology. This particularly may concern children examination, people with mental retardation and suspected of simulation.
The article presents the investigations of 7xxx aluminium alloys performed by the method of thermal and derivational analysis. The studies made it possible to identify the effect of the changes in the Cu concentration, the total Zn and Mg weight concentrations and the Zn/Mg weight concentration ratio on their crystallization process: the cooling as well as the kinetics and dynamics of the thermal process of cooling and crystallization. Metallographic studies were performed on the microstructure of the examined alloys and their HB hardness was measured. The evaluation of the changes was presented in reference to the model alloys EN AW-7003 and EN AW-7010, whose microstructure under the conditions of thermodynamic equilibrium are described by the phase diagrams: Al-Zn-Mg and Al-Zn-Mg-Cu. The performed investigations confirmed that the hardness HB of the examined alloys is mainly determined by the reinforcement of the matrix αAl by the introduced alloy additions and the presence of phases Θ(Al2Cu) and S(Al2CuMg) rich in copper, as well as η(MgZn2), in the examined alloys' microstructure. The increase of the amount of intermetallic phases precipitated in the microstructure of the examined alloys is caused, beside Cu, by the characteristic change of Zn wt. concentration and Mg. It was proposed that the process of one-stage thermal treatment of the examined alloys be introduced at a temperature of up to tJ-20 °C, which will prevent the exceedance of the solidus temperature.
In modern microelectronics progress has been made towards low power ultra large-scale integration (ULSI), and nano-structure devices such as single electron transistors and quantum dots. In this technology application of new materials, which includes high-κ dielectrics for the MOSFET transistors, with extraordinary purity and uniformity is required. Failure analysis and reliability investigations of such films very often requires highresolution local measurements of electrical surface parameters. This kind of experiments can be performed using conductive atomic force microscopy, which provides simultaneous measurement of surface topography and current ?owing through the investigated layer. In order to acquire reliable data, there was designed a precise measurement and control system, which included a low-noise current-to-voltage converter of picoampere resolution, a scanning stage with control electronics and a data acquisition system. In the paper we describe the architecture of the designed and applied experimental set-up. We also present results of simultaneous measurements of topography and current on gold and highly oriented pyrolytic graphite (HOPG).