We present computer simulations of a two-way ANOVA gage R&R study to determine the effects on the average speckle width of intensity patterns caused by scattered light reflected from random rough surfaces with different statistical characteristics. We illustrate how to obtain reliable computer data that properly simulate experimental measurements by means of the Fresnel diffraction integral, which represents an accurate analytical model for calculating the propagation of spatially-limited coherent beams that have been phase-modulated after being reflected by the vertical profiles of the generated surfaces. For our description we use four differently generated vertical profiles and five different vertical randomly generated roughness values.

Determining the size of source effect of a radiation thermometer is not an easy task and manufacturers of these thermometers usually do not indicate the deviation to the measured temperature due to this effect. It is one of the main uncertainty components when measuring with a radiation thermometer and it may lead to erroneous estimation of the actual temperature of the measured target. We present an empiric model to estimate the magnitude of deviation of the measured temperature with a long-wavelength infrared radiation thermometer due to the size of source effect. The deviation is calculated as a function of the field of view of the thermometer and the diameter of the radiating source. For thermometers whose field of view size at 90% power is approximately equal to the diameter of the radiating source, it was found that this effect may lead to deviations of the measured temperature of up to 6% at 200ºC and up to 14% at 500ºC. Calculations of the temperature deviation with the proposed model are performed as a function of temperature and as a function of the first order component of electrical signal.