In this work, vacuum hot pressed Ni-Mn-Sn-In Heusler alloys with different concentration of In (0, 2 and 4 at.%), were investigated. The magneto-structural behaviour and microstructure dependencies on chemical composition and on heat treatment were examined. It was found that the martensite start transformation temperature increases with growing In content and to a lesser extent with increasing temperature of heat treatment. The high energy X-ray synchrotron radiation results, demonstrated that both chemical composition as well as temperature of heat treatment slightly modified the crystal structures of the studied alloys. Microstructural investigation performed by transmission electron microscopy confirmed chemical composition and crystal structure changes in the alloys.
Crystals of PbTiO3 and 0.9PbTiO3-0.1(Na0.5Bi0.5)TiO3 were obtained by the flux growth method whereas crystals of (Na0.5Bi0.5)TiO3 were growth by the Czochralski method. Raman spectroscopy and polarized light microscopy were performed at room temperature. The Raman spectra of 0.9PbTiO3-0.1(Na0.5Bi0.5)TiO3 shown significant changes comparing to the base materials PbTiO3 and (Na0.5Bi0.5)TiO3. A domain structure was investigated by use polarized light microscopy. Dielectric permittivity measurements were carried out in the temperature range from 20°C to 550°C and a frequency from 1 kHz to 1 MHz. These showed higher dielectric permittivity for the crystals 0.9PbTiO3-0.1(Na0.5Bi0.5)TiO3 than the source materials PbTiO3 and (Na0.5Bi0.5)TiO3.
The high value of dielectric constant makes it possible to applied 0.9PbTiO3-0.1(Na0.5Bi0.5)TiO3 as efficient dielectric medium in a capacitors. The small size of the domain structure with the easy possibility of switching by application of an external electric field, give opportunities to apply these materials to FRAM memory applications. Moreover, the high sensitivity of these materials to the surrounding gases e.g. ammonia, chlorine, hydrogen, etc., allows the construction of sensor devices.