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Abstract

As it contains elements of complete digital impedance meter, the AD5933 integrated circuit is an interesting solution for impedance measurements. However, its use for measurements in a wide range of impedances and frequencies requires an additional digital and analogue circuitry. This paper presents the design and performance of a simple impedance meter based on the AD5933 IC. Apart from the AD5933 IC it consists of a clock generator with a programmable prescaler, a novel DC offset canceller for the excitation signal based on peak detectors and a current to voltage converter with switchable conversion ratios. The authors proposed a simple method for choosing the measurement frequency to minimalize errors resulting from the spectral leakage and distortion caused by a lack of an anti-aliasing filter in the DDS generator. Additionally, a novel method for the AD5933 IC calibration was proposed. It consists in a mathematical compensation of the systematic error occurring in the argument of the value returned from the AD5933 IC as a result. The performance of the whole system is demonstrated in an exemplary measurement.
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Authors and Affiliations

Konrad Chabowski
Tomasz Piasecki
Andrzej Dzierka
Karol Nitsch
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Abstract

Scanning probe microscopy (SPM) since its invention in the 80’s became very popular in examination of many different sample parameters, both in university and industry. This was the effect of bringing this technology closer to the operator. Although the ease of use opened a possibility for measurements without high labour requirement, a quantitative analysis is still a limitation in Scanning ProbeMicroscopes available on the market. Based on experience of Nano-metrology Group, SPM still can be considered as a tool for quantitative examination of thermal, electrical and mechanical surface parameters. In this work we present an ARMScope platform as a versatile SPM controller that is proved to be useful in a variety of applications: fromatomic-resolution STM (Scanning TunnellingMicroscopy) toMulti-resonance KPFM (Kelvin Probe force microscopy) to commercial SEMs (Scanning electron microscopes).

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Authors and Affiliations

Bartosz Świadkowski
Tomasz Piasecki
Maciej Rudek
Michał Świątkowski
Krzysztof Gajewski
Wojciech Majstrzyk
Michał Babij
Andrzej Dzierka
Teodor Gotszalk

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