In situ monitoring of the thickness of thin diamond films during technological processes is important because it allows better control of deposition time and deeper understanding of deposition kinetics. One of the widely used techniques is laser reflectance interferometry (LRI) which enables non-contact measurement during CVD deposition. The authors have built a novel LRI system with a 405 nm laser diode which achieves better resolution compared to the systems based on He-Ne lasers, as reported so far. The system was used for in situ monitoring of thin, microcrystalline diamond films deposited on silicon substrate in PA-CVD processes. The thickness of each film was measured by stylus profilometry and spectral reflectance analysis as a reference. The system setup and interferometric signal processing are also presented for evaluating the system parameters, i.e. measurement uncertainty, resolution and the range of measurable film thickness.

Hydroxyapatite (HAp) has been attracting widespread interest in medical applications. In a form of coating, it enables to create a durable bond between an implant and surrounding bone tissues. With addition of silver nanoparticles HAp should also provide antibacterial activity. The aim of this research was to evaluate the composition of hydroxyapatite with silver nanoparticles in a non-destructive and non-contact way. For control measurements of HAp molecular composition and solvent evaporation efficiency the Raman spectroscopy has been chosen. In order to evaluate dispersion and concentration of the silver nanoparticles inside the hydroxyapatite matrix, the optical coherence tomography (OCT) has been used. Five samples were developed and examined ‒ a reference sample of pure HAp sol and four samples of HAp colloids with different silver nanoparticle solution volume ratios. The Raman spectra for each solution have been obtained and analyzed. Furthermore, a transverse-sectional visualization of every sample has been created and examined by means of OCT.