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Abstract

We propose real time phase measurements in liquid crystals cells using Young's interferometer constructed with a new principle with possibility to control the distance between two point sources. The optical interference optical pattern is detected by a bicell photo-detector in a back Fourier focal plane. A phase modulation controlled by a monopixel liquid crystals’ cell placed in a reference arm of interferometer is observed as a dynamic shift of the fringes’ pattern in spatial domain. Concept of signals’ demodulation in the Fourier focal plane will be described using a new approach to the demodulation signals. In this work we evaluate the demodulation condition of our setup and we present measurements of a dynamic phase response for nematic liquid crystals and antiferroelectric liquid crystals cells.

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Authors and Affiliations

N. Bennis
I. Merta
A. Kalbarczyk
M. Maciejewski
P. Marc
A. Spadlo
L.R. Jaroszewicz
ORCID: ORCID
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Abstract

Optical low-coherence interferometry is one of the most rapidly advancing measurement techniques. This technique is capable of performing non-contact and non-destructive measurement and can be used not only to measure several quantities, such as temperature, pressure, refractive index, but also for investigation of inner structure of a broad range of technical materials. We present theoretical description of low-coherence interferometry and discuss its unique properties. We describe an OCT system developed in our Department for investigation of the structure of technical materials. In order to provide a better insight into the structure of investigated objects, our system was enhanced to include polarization state analysis capability. Measurement results of highly scattering materials e.g. PLZT ceramics and polymer composites are presented. Moreover, we present measurement setups for temperature, displacement and refractive index measurement using low coherence interferometry. Finally, some advanced detection setups, providing unique benefits, such as noise reduction or extended measurement range, are discussed.

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Authors and Affiliations

J. Pluciński
R. Hypszer
P. Wierzba
M. Strąkowski
M. Jędrzejewska-Szczerska
M. Maciejewski
B.B. Kosmowski

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