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Abstract

This paper is focused on multiple soft fault diagnosis of linear time-invariant analog circuits and brings a method that achieves all objectives of the fault diagnosis: detection, location, and identification. The method is based on a diagnostic test arranged in the transient state, which requires one node accessible for excitation and two nodes accessible for measurement. The circuit is specified by two transmittances which express the Laplace transform of the output voltages in terms of the Laplace transform of the input voltage. Each of these relationships is used to create an overdetermined system of nonlinear algebraic equations with the circuit parameters as the unknown variables. An iterative method is developed to solve these equations. Some virtual solutions can be eliminated comparing the results obtained using both transmittances. Three examples are provided where laboratory or numerical experiments reveal effectiveness of the proposed method.
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Bibliography

[1] D. Gizopoulos, Advances in electronic testing. Challenges and methodologies. (Springer, Dordrecht, 2006)
[2] P. Kabisatpathy, A. Barua and S. Sinha, Fault diagnosis of analog integrated circuits. (Springer, Dordrecht, 2005).
[3] Y. Sun (ed.), Test and diagnosis of analog mixed-signal and RF integrated circuits: the system on chip approach, (IET Digital Library, UK, 2008)
[4] D. Binu, B.S. Kariyappa, “A survey on fault diagnosis of analog circuits: Taxonomy and state of the art”, Int. J. Electron. Commun. (AEÜ), vol. 73, pp. 68-83, 2017. doi: 10.1016/j.aeue.2017.01.002.
[5] Z. Czaja, “Using a square-wave signal for fault diagnosis of analog parts of mixed-signal electronic embedded systems”, IEEE Trans. Instrum. Meas., vol. 57, pp. 1589-1595, 2008. doi: 10.1109/TIM.2008.925342
[6] H. Han, H. Wang, S. Tian, N. Zhang, “A new analog circuit fault diagnosis method based on improved Mahalanobis distance”, J. Electron. Test., vol. 29, pp. 95–102, 2013. https://doi.org/10.1007/s10836-012- 5342-z.
[7] Ch. Yang, S. Tian, B. Long, F. Chen, “Methods of handling the tolerance and test-point selection problem for analog-circuit fault diagnosis”, IEEE Trans. Instrum. Means., vol. 60, pp. 176-185, 2011. doi: 10.1109/TIM.2010.2050356
[8] Q.Z. Zhou, Y.L. Xie, X.F. Li, D.J. Bi, X. Xie, S.S. Xie, “Methodology and equipments for analog circuit parametric faults diagnosis based on matrix eigenvalues”, IEEE Trans. Appl. Superconductivity, vol. 24, pp. 1–6, 2014. https://doi.org/10.1109/TASC.2014.2340447.
[9] Y. Deng, Y. N. Liu, “Soft fault diagnosis in analog circuits based on bispectral models”, J. Electron. Test., vol. 33, pp. 543-557, 2017. https://doi.org/10.1007/s10836-017-5686-5.
[10] S. Djordjevic, M.T. Pesic, “A fault verification method based on the substitution theorem and voltage-current phase relationship”, J. Electron. Test., vol. 36, pp. 617-629, 2020. https://doi.org/10.1007/s10836-020- 05901-5.
[11] T. Gao, J. Yang, S. Jiang, “A novel incipient fault diagnosis method for analog circuits based on GMKL-SVM and wavelet fusion feature”. IEEE Trans. Instrum. Meas., vol. 70, 2021. https://doi.org/10.1109/TIM.2020.3024337.
[12] Y. Li, R. Zhang, Y. Guo, P. Huan, M. Zhang, “Nonlinear soft fault diagnosis of analog circuits based on RCCA-SVM”, IEEE Access., vol. 8, pp. 60951-60963, 2020. doi.org/10.1109/ACCESS.2020.2982246.
[13] M. Tadeusiewicz, S. Hałgas, “A new approach to multiple soft fault diagnosis of analog BJT and CMOS circuits”, IEEE Trans. Instrum. Meas., vol. 64, pp. 2688–2695, 2015. https://doi.org/10.1109/TIM.2015.2421712.
[14] M. Tadeusiewicz, S. Hałgas, “A method for local parametric fault diagnosis of a broad class of analog integrated circuits”, IEEE Trans. Instrum. Meas., vol. 67, pp. 328–337, 2018. https://doi.org/10.1109/TIM.2017.2775438.
[15] Y. Xie, X. Li, S. Xie, X. Xie, Q. Zhou, “Soft fault diagnosis of analog circuits via frequency response function measurements”, J. Electron. Test., vol. 30, pp. 243–249, 2014. https://doi.org/10.1007/s10836-014- 5445-9.
[16] M. Tadeusiewicz, S. Hałgas, M. Korzybski, “An algorithm for soft-fault diagnosis of linear and nonlinear circuits”, IEEE Trans. Circ. Syst.-I., vol. 49, pp. 1648-1653, 2002. doi: 10.1109/TCSI.2002.804596.
[17] M. Tadeusiewicz, S. Hałgas, “Soft fault diagnosis of linear circuits with the special attention paid to the circuits containing current conveyors”, Int. J. Electron Commun. (AEÜ), vol. 115, 2020. https://doi.org/10.1016/j.aeue.2019.153036.
[18] M. Tadeusiewicz and S. Hałgas, “A method for multiple soft fault diagnosis of linear analog circuits”, Measurement, vol. 131, pp. 714-722, 2019. doi: 10.1016/j.measurement.2018.09.001.
[19] M. Jahangiri, F. Razaghian, “Fault detection in analogue circuit using hybrid evolutionary algorithm and neural network”, Analog Int. Cir. Sig. Proc., vol. 80, pp. 551-556, 2014. https://doi.org/10.1007/s10470-014- 0352-7
[20] P. Jantos, D. Grzechca, J. Rutkowski, “Evolutionary algorithms for global parametric fault diagnosis in analogue integrated circuits”, Bull. Polish Acad. Scien., vol. 60, pp. 133-142, 2012. doi: 10.2478/v10175- 012-0019-4
[21] C. Yang, “Multiple soft fault diagnosis of analog filter circuit based on genetic algorithm”, IEEE Access., vol. 8, pp. 8193-8201, 2020. https://doi.org/10.1109/ACCESS.2020.2964054.
[22] D. Grzechca, “Soft fault clustering in analog electronic circuits with the use of self organizing neural network”, Metrol Meas Syst., vol. 8, pp. 555–568, 2011. doi: 10.2478/v10178-011-0054-8
[23] B. Long, M. Li, H. Wang, S. Tian, “Diagnostics of analog circuits based on LS-SVM using time-domain features”, Circuits Syst. Signal. Process., vol. 32, pp. 2683-2706, 2013. https://doi.org/10.1007/s00034-013-9614-3
[24] R. Sałat, S, Osowski, “Support Vector Machine for soft fault location in electrical circuits”, J. Intelligent Fuzzy Systems., vol. 22, pp. 21-31, 2011. doi: 10.3233/IFS-2010-0471.
[25] D. Grzechca, “Construction of an expert system based on fuzzy logic for diagnosis of analog electronic circuits”, Int. Journal of Electronic and Telecomunications, vol. 61, pp. 77-82, 2015. doi: 10.1515/eletel-2015- 0010
[26] P. Bilski, “Analysis of the ensemble of regression algorithms for the analog circuit parametric identification”, Measurement, vol. 170, pp. 503–514, 2020. https://doi.org/10.1016/j.measurement.2020.107829.
[27] M. Tadeusiewicz, M. Ossowski, “A verification technique for multiple soft fault diagnosis of linear analog circuits”, Int. Journal of Electronic and Telecomunications, vol. 64, pp. 83-89, 2018. doi: 10.24425/118150.
[28] M. Tadeusiewicz, M. Ossowski, “Modeling analysis and diagnosis of analog circuits in z-domain”, J. Circ. Syst. Comput, vol. 29, no. 02, 2020. https://doi.org/10.1142/S0218126620500280
[29] G. Fedi, S. Manetti, M.C. Piccirilli, J. Starzyk, “Determination of an optimum set of testable components in the fault diagnosis of analog linear circuits”, IEEE Trans. Circ. Syst.-I, vol. 46, pp. 779-787, 1999. doi: 10.1109/81.774222
[30] S. Manetti, M.C. Piccirilli, “A singular-value decomposition approach for ambiguity group determination in analog circuits”, IEEE Trans. Circ. Syst.-I, vol. 50 pp. 477-487, 2003. doi: 10.1109/TCSI.2003.809811.
[31] S. Saeedi, S.H. Pishgar, M. Eslami, “Optimum test point selection method for analog fault dictionary techniques”, Analog Integr. Circuits Signal Processing., vol. 100, pp. 167-179, 2019. https://doi.org/10.1007/s10470-019-01453-7.
[32] X. Tang, A. Xu, R. Li, M. Zhu, J. Dai, “Simulation-based diagnostic model for automatic testability analysis of analog circuit”, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems., vol. 37, pp. 1483-1493, 2018. https://doi.org/10.1109/TCAD.2017.2762647.
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Authors and Affiliations

Michał Tadeusiewicz
1
Marek Ossowski
1
Marek Korzybski
1

  1. Lodz University of Technology, Department of Electrical, Electronic, Computer and Control Engineering, Lodz, Poland

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