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Abstract

The sensitivity of III-V-based infrared detectors is critically dependent upon the carrier concentration and mobility of the absorber layer, and thus, accurate knowledge of each is required to design structures for maximum detector performance. Here, measurements of the bulk in-plane resistivity, in-plane mobility, and carrier concentration as a function of temperature are reported for non-intentionally doped and Si-doped mid-wave infrared InAs0.91Sb0.09 alloy and InAs/InAs0.65Sb0.35 type-II superlattice materials grown on GaSb substrates. Standard temperature- and magnetic-field-dependent resistivity and the Hall measurements on mesa samples in the van der Pauw configuration are performed, and multi-carrier fitting and modelling are used to isolate transport of each carrier species. The results show that up to 5 carrier species of the surface, interface and bulk variety contribute to conduction, with bulk electron and hole mobility up to 2·105 cm2/V s and 8·103 cm2/V s, respectively and background dopant concentration levels were between 1014 and 1015 cm−3. The in-plane mobility temperatures dependence is determined and trends of each carrier species with temperature and dose are analysed.
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Authors and Affiliations

Christian P. Morath
1
ORCID: ORCID
Lilian K. Casias 
2
ORCID: ORCID
Gilberto A. Umana-Membreno 
3
ORCID: ORCID
Preston T. Webster
1
Perry C. Grant 
1
ORCID: ORCID
Diana Maestas
1
Vincent M. Cowan
1
ORCID: ORCID
Lorenzo Faraone 
3
ORCID: ORCID
Sanjay Krishna 
4
ORCID: ORCID
Ganesh Balakrishnan
5
ORCID: ORCID

  1. U.S. Air Force Research Lab Space Vehicles Directorate, 3550 Kirtland AFB, 427 Aberdeen Ave., NM 87117, USA
  2. Sandia National Laboratories, 1515 Eubank Blvd. SE, Albuquerque, NM 87185, USA
  3. School of Electrical, Electronic, and Computer Engineering, The University of Western Australia, 25 Fairway, Crawley WA 6009, Australia
  4. Department of Electrical Engineering, The Ohio State University, 2015 Neil Ave., Columbus, OH 43210, USA
  5. Center for High Technology Materials, University of New Mexico, 1313 Goddard St. SE, Albuquerque, NM 87106, USA
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Abstract

Careful selection of the physical model of the material for a specific doping and selected operating temperatures is a non-trivial task. In numerical simulations that optimize practical devices such as detectors or lasers architecture, this challenge can be very difficult. However, even for such a well-known material as a 5 µm thick layer of indium arsenide on a semi-insulating gallium arsenide substrate, choosing a realistic set of band structure parameters for valence bands is remarkable. Here, the authors test the applicability range of various models of the valence band geometry, using a series of InAs samples with varying levels of p-type doping. Carefully prepared and pretested the van der Pauw geometry samples have been used for magneto-transport data acquisition in the 20–300 K temperature range and magnetic fields up to ±15 T, combined with a mobility spectra analysis. It was shown that in a degenerate statistic regime, temperature trends of mobility for heavy- and light-holes are uncorrelated. It has also been shown that parameters of the valence band effective masses with warping effect inclusion should be used for selected acceptor dopant levels and range of temperatures.
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Authors and Affiliations

Jarosław Wróbel
1
ORCID: ORCID
Gilberto A. Umana-Membreno
2
ORCID: ORCID
Jacek Boguski
1
ORCID: ORCID
Sebastian Złotnik
1
ORCID: ORCID
Andrzej Kowalewski
1
ORCID: ORCID
Paweł Moszczyński
3
ORCID: ORCID
Jarek Antoszewski
2
ORCID: ORCID
Lorenzo Faraone
2
Jerzy Wróbel
1 4
ORCID: ORCID

  1.  Institute of Applied Physics, Military University of Technology, gen. Sylwestra Kaliskiego 2, 00-908 Warsaw, Poland
  2. Dept. of Electrical, Electronic and Computer Engineering, The University of Western Australia, 35 Stirling Highway, Crawley WA 6009, Australia
  3. Faculty of Cybernetics, Military University of Technology, gen. Sylwestra Kaliskiego 2, 00-908 Warsaw, Poland
  4. Institute of Physics, Polish Academy of Sciences, Aleja Lotników 32/46, 02-668 Warsaw, Poland

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