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Abstract

This paper is devoted to multiple soft fault diagnosis of analog nonlinear circuits. A two-stage algorithm is offered enabling us to locate the faulty circuit components and evaluate their values, considering the component tolerances. At first a preliminary diagnostic procedure is performed, under the assumption that the non-faulty components have nominal values, leading to approximate and tentative results. Then, they are corrected, taking into account the fact that the non-faulty components can assume arbitrary values within their tolerance ranges. This stage of the algorithm is carried out using the linear programming method. As a result some ranges are obtained including possible values of the faulty components. The proposed approach is illustrated with two numerical examples.

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Authors and Affiliations

Michał Tadeusiewicz
Stanisław Hałgas
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Abstract

This overview paper presents and compares different methods traditionally used for estimating damped sinusoid parameters. Firstly, direct nonlinear least squares fitting the signal model in the time and frequency domains are described. Next, possible applications of the Hilbert transform for signal demodulation are presented. Then, a wide range of autoregressive modelling methods, valid for damped sinusoids, are discussed, in which frequency and damping are estimated from calculated signal linear self-prediction coefficients. These methods aim at solving, directly or using least squares, a matrix linear equation in which signal or its autocorrelation function samples are used. The Prony, Steiglitz-McBride, Kumaresan-Tufts, Total Least Squares, Matrix Pencil, Yule-Walker and Pisarenko methods are taken into account. Finally, the interpolated discrete Fourier transform is presented with examples of Bertocco, Yoshida, and Agrež algorithms. The Matlab codes of all the discussed methods are given. The second part of the paper presents simulation results, compared with the Cramér-Rao lower bound and commented. All tested methods are compared with respect to their accuracy (systematic errors), noise robustness, required signal length, and computational complexity.

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Authors and Affiliations

Tomasz Zieliński
Krzysztof Duda

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