Search results

Filters

  • Journals

Search results

Number of results: 1
items per page: 25 50 75
Sort by:
Download PDF Download RIS Download Bibtex

Abstract

The paper presents an analogue circuit testing method that engages the analysis of the time response to a non-periodic stimulus specialized for the verification of selected specifications. The decision about the current circuit diagnostic state depends on an amplitude spectrum decomposition of the time response measured during the test. A shape of the test excitation spectrum is optimized with the use of a differential evolution algorithm and it allows for achieving maximum fault coverage and the optimal conditions for fault isolation. Genotypes of the evolutionary system encode the amplitude spectrum of candidates for testing stimuli by means of rectangle frequency windows with amplitudes determined evolutionarily.

Go to article

Authors and Affiliations

Tomasz Golonek
Piotr Jantos
Jerzy Rutkowski

This page uses 'cookies'. Learn more