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Abstract

Thermal processes in domain of thin metal film subjected to a strong laser pulse are discussed. The heating of domain considered causes

the melting and next (after the end of beam impact) the resolidification of metal superficial layer. The laser action (a time dependent belltype

function) is taken into account by the introduction of internal heat source in the energy equation describing the heat transfer in domain

of metal film. Taking into account the extremely short duration, extreme temperature gradients and very small geometrical dimensions of

the domain considered, the mathematical model of the process is based on the dual phase lag equation supplemented by the suitable

boundary-initial conditions. To model the phase transitions the artificial mushy zone is introduced. At the stage of numerical modeling the

Control Volume Method is used. The examples of computations are also presented.

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Authors and Affiliations

E. Majchrzak
B. Mochnacki
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Abstract

Heating process in the domain of thin metal film subjected to a strong laser pulse are discussed. The mathematical model of the process

considered is based on the dual-phase-lag equation (DPLE) which results from the generalized form of the Fourier law. This approach is,

first of all, used in the case of micro-scale heat transfer problems (the extremely short duration, extreme temperature gradients and very

small geometrical dimensions of the domain considered). The external heating (a laser action) is substituted by the introduction of internal

heat source to the DPLE. To model the melting process in domain of pure metal (chromium) the approach basing on the artificial mushy

zone introduction is used and the main goal of investigation is the verification of influence of the artificial mushy zone ‘width’ on the

results of melting modeling. At the stage of numerical modeling the author’s version of the Control Volume Method is used. In the final

part of the paper the examples of computations and conclusions are presented.

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Authors and Affiliations

B. Mochnacki
M. Ciesielski

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