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[References = "Mauchamp V. \(2006\), Ab initio simulation of the electron energy\-loss near\-edge structures at the Li K edge in Li, Li<sub>2<\/sub>O, and LiMn<sub>2<\/sub>O<sub>4<\/sub>, Phys. Rev, B 74, 115106, doi.org\/10.1103\/PhysRevB.74.115106"]
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Bulletin of the Polish Academy of Sciences Technical Sciences (1)
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Advanced microstructure diagnostics and interface analysis of modern materials by high-resolution analytical transmission electron microscopy
W. Neumann
H. Kirmse
I. Häusler
A. Mogilatenko
Ch. Zheng
W. Hetaba
Bulletin of the Polish Academy of Sciences Technical Sciences | 2010 | 58 | No 2
| 237-253 | DOI:
10.2478/v10175-010-0023-5
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Authors and Affiliations
Authors and Affiliations
W. Neumann
H. Kirmse
I. Häusler
A. Mogilatenko
Ch. Zheng
W. Hetaba
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