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[References = "Smith D. \(2008\), Development of aberration\-corrected electron microscopy, Microscopy and Microanalysis, 14, 2."]
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Bulletin of the Polish Academy of Sciences Technical Sciences (1)
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Advanced microstructure diagnostics and interface analysis of modern materials by high-resolution analytical transmission electron microscopy
W. Neumann
H. Kirmse
I. Häusler
A. Mogilatenko
Ch. Zheng
W. Hetaba
Bulletin of the Polish Academy of Sciences Technical Sciences | 2010 | 58 | No 2
| 237-253 | DOI:
10.2478/v10175-010-0023-5
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Authors and Affiliations
Authors and Affiliations
W. Neumann
H. Kirmse
I. Häusler
A. Mogilatenko
Ch. Zheng
W. Hetaba
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