A novel all optical measurement scheme is proposed to measure wideband microwave frequencies up to 30 GHz. The proposed method is based on a four-wave mixing (FWM) approach in a semiconductor optical amplifier (SOA) of both even order side-bands generated by an unknown microwave frequency modulating an optical carrier. The optical power of a generated FWM signal depends on frequency spacing between extracted side-bands. A mathematical relation is established between FWM power and frequency of an unknown signal. A calibration curve is drawn based on the mathematical relation which predicts the unknown frequency from power withdrawn after FWM

Optical sampling based on ultrafast optical nonlinearities is a useful technique to monitor the waveforms of ultrashort optical pulses. In this paper, we present a new implementation of optical waveform sampling systems by employing our newly constructed free-running mode-locked fibre laser with a tunable repetition rate and a low timing jitter, an all-optical waveform sampler with a highly nonlinear fibre (HNLF), and our developed computer algorithm for optical waveform display and measurement, respectively. Using a femtosecond fibre laser to generate the highly stable optical sampling pulses and exploiting the four-wave mixing effect in a 100 m-long HNLF, we successfully demonstrate the all-optical waveform sampling of a 10 GHz optical clock pulse sequence with a pulse width of 1.8 ps and a 80 Gbit/s optical data signal, respectively. The experimental results show that waveforms of the tested optical pulse signals are accurately reproduced with a pulse width of 2.0 ps. This corresponds to a temporal resolution of 0.87 ps for optical waveform measurement. Moreover, the optical eye diagram of a 10Gbit/s optical data signal with a 1.8 ps pulse width is also accurately measured by employing our developed optical sampling system.