Abstract
The article is devoted to the method facilitating the
diagnostics of dynamic faults in networks of interconnection in
systems-on-chips. It shows how to reconstruct the erroneous test
response sequence coming from the faulty connection based on
the set of signatures obtained as a result of multiple compaction
of this sequence in the MISR register with programmable
feedback. The Chinese reminder theorem is used for this purpose.
The article analyzes in detail the various hardware realizations of
the discussed method. The testing time associated with each
proposed solution was also estimated. Presented method can be
used with any type of test sequence and test pattern generator. It
is also easily scalable to any number of nets in the network of
interconnections. Moreover, it supports finding a trade-off
between area overhead and testing time.
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