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Abstract

In this paper the method of fast impedance spectroscopy of technical objects with high impedance (|Zx| ≥1 GΩ) is evaluated by means of simulation and a practical experiment. The method is based on excitation of an object with a sinc signal and sampling the response signals proportional to current flowing through and voltage across the measured impedance. The object’s impedance spectrum is obtained with the use of continuous Fourier transform on the basis of linear approximations between samples in two acquisition sections, connected with the duration of the sinc signal. The method is first evaluated in MATLAB by means of simulation. An influence of the sinc signal duration and the number of samples on impedance modulus and argument measurement errors is explored. The method is then practically verified in a constructed laboratory impedance spectroscopy measurement system. The obtained acceleration of impedance spectroscopy in the low frequency range (below 1 Hz) and the decrease of the number of acquired samples enable to recommend the worked out method for implementation in portable impedance analyzers destined for operation in the field.

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Authors and Affiliations

Michał Kowalewski
Grzegorz Lentka
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Abstract

The Multi-Tone (MT) signal with uniform amplitudes can be used for DAC testing. This paper shows an easier way to generate a MT signal using several impulse signals. The article also analyzes qualities of methods for testing the dynamic parameters of Digital to Analog Converters using an impulse signal. The MT, Damped Sine Wave (DSW) and Sinx/x (SINC) signals will be used as the source for these tests. The Effective Number of Bits (ENOB) and Signal to noise and distortion (SINAD) are evaluated in the frequency domain and they are modified using the Crest Factor (CF) correction and compared with the standard results of the Sine Wave FFT test. The first advantage of the test using an impulse signal is that you need fewer input parameters to create the band signal for testing the DAC. The second one is to reduce the testing time using a band signal in comparison with multiple tests using a single sine wave.

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Authors and Affiliations

Josef Vedral
Pavel Fexa

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